OPTICA
APPLICATA
Vol. XXVIII (98) No. 3
PL ISSN 0078-5466
Index 367729
A j o i nt p u b l i c a t i o n of the
INSTITUTE OF PHYSICS, TECHNICAL UNIVERSITY OF WROCŁAW, POLAND&
SPIE/POLAND CHAPTER in association withSPIE-THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Contents
Skipirzepski P., Nowak P., Optimization of the optical granularity measurement con ditions of model photographic lay ers... 173 Latacz L., Nowak P., Modelling of the exposure distribution inside heterogeneous
radiosensitive lay ers... 183 Jabczyński J. K., Kopczyński K., Marciniak P., Investigations of cavity losses in
diode pumped la sers... 191 Dobek K., Karolczak J., Komar D., Kubicki J., Szymański M., Wróżowa T.,
Ziółek M , Maciejewski A., Optical calibration of the picosecond time scale and correlated background elimination in fluorescence dynamics measurements by time-correlated photon counting... 201 Pater K., Kuźmiński S., Surface state density on the ZnTe and Cd0 98Fe0 02Te free
surfaces... 209 Martînez-corral M , Kowalczyk M., Zapata-RodrTguez C, Andrés P., Tunable
axial resolution in confocal scanning microscopy by controlled symmetrical de-focusing... 213 Jagoszewski E , Fractional Fourier transform in optical setups... 227 Zachorowski J., Pałasz T., Gawlik W., Magneto-optical trap for rubidium atoms 239 Letters to the Editor
Magiera A n Imaging of the clear slit in a two-photon coherent fluorescent
micro-scope equipped with a pupil filter of 1 — x 2 , x 2 , and Lanczos ty p e s... 249