OPTICA
APPLICATA
INTERNATIONAL ADVISORY BOARD:Krzysztof Abramski - physics and technology of lasers, laser metrology, optotelecommunications
Oleg V. Angelsky - holography, interferometry, measurements of surface roughness, fractal optics, optical vortices
Siegfried Boseck - light, electron and ultrasonic microscopy
Roman S. Ingarden - diffraction theory of optical aberrations, transport of information in optical systems
Eugeniusz Jagoszewski (Chairman) - Fourier optics, holography
Romuald Jóźwicki - diffraction theory of imaging, interferometry, digital holography
Franciszek Kaczmarek - laser physics, nonlinear optics
Henryk Kasprzak - applied optics, physiological optics
Bolesław Kędzia - physiological optics, vision process
Małgorzata Kujawińska - optical metrology, machine vision, opto-numerical methods and systems for multimedia and engineering
Miroslav Miler - wave optics, holographic methods, diffractive components, optical waveguides
Jan Misiewicz - optical properties of solid state, semiconductors, optoelectronics
Włodzimierz Nakwaski - semiconductor lasers and light-emitting diodes
Jan Perina - quantum, statistical and nonlinear optics
Tadeusz Stacewicz - laser spectroscopy and its applications
Tomasz Szoplik - optical and digital image processing
Tomasz Woliński - fiber optic sensors and systems, optics of liquid crystals, polarization optics
OPTICA
APPLICATA
Vol. XXXin (2003) No. 4
PL ISSN 0078-5466
Index 367729
A jo in t p u b lication o f the
INSTITUTE OF PHYSICS WROCŁAW UNIVERSITY OF TECHNOLOGY POLAND&
SPIE/POLAND CHAPTER in association withSPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING
Contents
Fiber optics
Raman gain characterization in standard single mode optical fibres for optical simulation purposes
Paulo S. Andre, Rosario Correia, Luis M. Borghesi Jr, Antonio L.J. Teixeira, RogerioN. Nogueira, Mario J.N. Lima, Hypolito J. Kalinowski, Ferreira Da Rocha, Joao L. Pinto... 559
Analysis o f the spatial distribution o f luminous intensity at the fibre output
Adam Nikolajew, Jan Do r o s z... 575
Scanning electron microscopy examination o f telecommunication single mode fiber splices
Jan Hejna, Marek Ratuszek, Jacek Majewski, Zbigniew Zakrzewski... 583
Holography
Selected problems in holographic memory design
Andrzej Andruchów, Aleksander Jaskółka, Eugeniusz Jagoszewski ... 591
Holographic confocal microscope
Irena Antośoya, ZdenSk Harna ... 605
Interference
Investigations o f multimode interference structures made by ion exchange in glass
Marek Błahut, Damian Kasprzak ... 613
Accurate interference pattern analysis module o f automatic measurement system
Allen J. Whang, Chi-Kuei Ch u n g... 627
Digital electronic imaging
Informational representation o f fundamental phenomena in the digital electro-optical imaging devices
558
Laser physics
Fluctuation o f colliding-enhanced YAG phase-conjugate ring cavity in primary resonator stability
Jun Qu, Weijun Zhang, Xiaoming Gao, Anling Liu, Wei Huang, Shixin Pei, Jie Shao, Yong Ya n g... 649
Photonic band structure
Absolute photonic band gap from 2D square compound lattices
Fang Yuntuan, Shen Tinggen, Tan Xi l i n... 655
Thin film characterization
Structural, optical and electrical characterization o f Co-Pd doped Ti02 semiconducting thin films sputtered on silicon
Jarosław Domaradzki, Eugeniusz Prociów, Danuta Kaczmarek, Tadeusz Berlicki, Robert Kudrawiec, Jan Misiewicz, Witold Mielcarek... 661
Scanning thermal microscopy
Thermal characterization o f micro-devices with far and near field microscopy
Roman F. Szeloch, Teodor P. Gotszalk, Paweł Janus ... 669
State machine
Just-enough-time signaling protocol: formal description using extended finite state machine (EFSM)
A. Halim Zaim ... 677
Optical element measurements
Thin glass mirors for the Pierre Auger ProjectMartin VlCek, Petr SchovAnek, Miroslav Pałatka, Miroslav Hrabovsky... 689
Testing
Referenceless testing o f vortex optical beams
