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Absorption coefficient of zinc phosphide on porous glass

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Optica Applicata, Vol X X I V , N o. 1 - 2 , 1994

Absorption coefficient of zinc phosphide

on porous glass

K . S. Pater

Institute o f Physics, Technical U niversity o f W roclaw, W ybrzeże W yspiańskiego 27, 5 0 —370 W rocław, Poland.

The transm ission spectra of zinc phosphide on porous glass have been measured. The absorption coefficient of the zinc phosphide thin layer has been calculated.

1. Introduction

Porous glass is produced from sodium borosilicate glass by the leaching process. This material can be used as a substrate for production of elements in optics and optoelectronics [1] —[6]. In the past years, it has been shown that after impreg­ nation of the glass with inorganic semiconductors a sharp absorption edge was obtained [7].

To obtain the porous glass, the sodium-borosilicate glass was heated at 950 K for the phase separation. During leaching in HCL and deionized water, the alkali-boron phase was leached and almost pure silica porous glass was obtained. The electron microscope micrographs show that the pores are interconnected. The diameters of the pores have been calculated using the absorption-desorption technique [6]. In the investigated glass the diameters of the pores amounted to 2 —5 nm.

The thin layer of the zinc phosphide was obtained by thermal evaporation of the monocrystalline material in vacuum. After evaporation, the samples were heated at high temperature (950 K) during 2 h in the argon atmosphere.

The optical absorption was measured before and after baking in the wavelength range from 0.5 to 1.2 pm.

2. Results

The light transmission of the porous glass (Fig. 1, curve 1) is small because of the porosity of the glass. After deposition of zinc phosphide on the glass surface, the light transmission decreases about 30—40% (Fig. 1, curve 2). Baking of the sample causes the increase of the transmission almost to that observed for pure glass sample (Fig. 1, curve 3).

The transmission coefficient of the zinc phosphide can be obtained by comparing the transmission spectra of the pure glass with the spectra obtained for the glass covered by zinc phosphide.

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74 K. S. Pater

F ig. 1. Light transm ission spectra fo r 1 — porous glass w ithout cover, 2 — porous glass with deposited zinc phosphide layer, 3 — porous glass w ith zinc phosphide after baking in 9S0 K in argon atm osphere

The best fitting (Fig. 2) of the absorption coefficient to the Fagen data [8] was received for the layer grown of 0.5 pm thickness and about 30% reflectance. For the layer after baking, in order to fulfill the best fitting conditions, almost zero value of the light reflection has been assumed and 0.2 pm thickness is obtained.

Fig. 2. A bsorption coefficient spectra for: 1 — the deposited zinc phosphide layer, 2 — zinc phosphide layer alter baking

For the absorption spectrum (Fig. 2, curves 1 and 2) of zinc phosphide deposited on the porous glass, there does not exist any sharp absorption edge observed for the monocrystal. Moreover, the spectra are smoother in comparison with the curves obtained for the polyciystalline thin films observed by other authors [7], [8].

The substrate influences essentially the optical properties of the layer. The mean thickness of the zinc phosphide layer is small and the layer has probably developed a three-dimensional structure. Due to the surface roughness a signif­ icant portion of the incident light is scattered inward the sample. The scattering effect for the extremely thin layer causes that the absorption edge is indefinite and difficult to determine. The light scattering is stronger after baking and the

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Absorption coefficient o f zinc phosphide ... 75

reflectance is absent In this case, it is supposed that the zinc phosphide creates clusters of the sharp edges of the pores and the major part of the deposited layer has been evaporated outwards.

References

[1 ] Mazurin O. V., Porai—K osras R A-, Phase Separation in Glass, N orth-H olland, 1984. [2 ] Janowski F., Heyer W., Porose Glaser, VEB Deutscher Verlag fur Grundstoffindustrie, Leipzig

1982.

[3 ] Macedo P. B , Samanta M , Simmons J , Patent USA N o. 4183620, 1980.

[4 ] Sukhanov V. J , Khazova M . V , Kursakova A. M , Andreeva O . V , O p t Spektro sk , fin R ussian)

64 (1974), 474.

[5 ] Kaps Cił, Schubert R^ Franke G , Proc. XVI Congress on Glass, [E d.] Bol. Soc. Esp. Ceram. Vid.

VoL 3, 1992, p. 109.

[6 ] Marczuk Ł , Prokopovich L·, Roizin Y , Rysiakiewicz- Pasek R , Proc. SPIE 1513 (1991), 291. [7 ] Sobolev V. V„ Syrbu N . N „ Phys. S tatu s SoUdi B 64 (1974), 423.

[8 ] Fagen R A , J. A ppl. Phys. 50 (1979), 6505.

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