OPTICA
APPLICATA
VoL XXXI (2001) No. 1
PL ISSN 0078-5466 Index 367729A j o i n t p u b l i c a t i o n o f t he
INSTITUTE OF PHYSICS, WROCŁAW UNIVERSITY OF TECHNOLOGY, POLAND&
SPIE/POLAND CHAPTER in association with SP IE -T H E INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERINGContents
Editorial ... 3
WiKTORCZYK T^ Rare earth oxide films: their preparation and characterization . . . 5
ŻUKOWSKA K., OLBSZKiEwicz E., Eiiipsometry in optical studies o f thin films conducted at the Institute o f Physics of Wrocław University o f Technology ... 35
DoBiBRZBWSKA-MozRZYMAS E., BtBGAŃSKi P., PiBCiUL E., D iscontinu ous m etal Ulrns on dielectric substrates, their optical and electrical properties, structures and statis tical descriptions ... 53
WiKTORCZYK T., Optical properties of electron beam deposited lutetium oxide thin
films ... 83 JARZABBK B., JuRUSiK J., CisowsKi J., NowAK M , Roughness of amorphous Zn-P
thin films ... 93 RATUSZNIK G .J , NAJECHALSKI P., ClOLBK R., PURA B., ZADROZNA L, MROZINSKI H ,
Determination of the thickness and optical constants of polyarylates with hetero cyclic side chain group ... 103
OPARA T.A., Diffraction methods of drop size measurement in polydispersive media 115 OPARA T.A., Test stands for measuring the average diameter of the fuel aerosol drops
by diffraction method ... 143
LATACZ L., Now AK P., M o d el exam ination o f application o f fluorescent substance to
silver halide light-sensitive layers ... 165
LATACZ L., NowAK P , M o d el exam ination o f the crossover effect in tw o-layer light
-sensitive system ... 177
RAJKOWSKi B., N ow A K P., Model examinations of edge effects in light-sensitive materials 185
DULSKI R., NIEDZIELA T., Verification of the correctness o f thermal imaging modelling 193
KuRZYNOWSKi P., RATAJCZYK F , Effective measurements of birefringence properties of nondichroic media using Poincare sphere ... 203
PLiŃSKi E.F., WITKOWSKI J.S., Thermal conductivity and temperature distribution in RF excited CO3, CO, and Xe laser media ... 209
ANDRZEJEWSKI D , PoDBiBLSKA H., Mutual influences of sol-gel matrices and dopants on the materials optical properties ... 223
NAWROCKA M. S-, URBAŃCZYK W., Optimization o f detection system for low-coherence interferometric sensors based on highly birefringent fibers ... 231
2
Letter* to the Editor
KuRZYNOWSKi P., W oiN iA K W. A., RATAJCZYK Polariscopic m easurem ent o f the optical path difference usin g the spectra! analysis m ethod ... 251
LBCHNA-MARCZYRSKA M ., PoDBtBLSKA H , Influence o f the tem perature o f prepara tio n process on refractive index o f sol-gel m atrices ... 257
Editorial
Some fifty years ago, thanks to the initiative and efforts of Professor Cecyiia Wesołowska, the investigations of thin fiim physics began at the Institute of Physics of the Technicai University of Wrocław (Połand). In the post-wars reałity, research basis in Połish Regained Territories had to be created from the very foundation. Professor Wesołowska contributed greatły to the preparation of essentia! apparatus equipment, such as vacuum evaporator, spectrophotometer, and opticał microscope. The expérimentai base for interference microscopy we owe to Docent Kazimiera Fulińska. Research in thin metał and diełectric films was at the first stage of an applied character, being an answer to the needs of developing opticał industry and scientific investigations done in various fields. Among the achievements of this period one list the method of obtaining interference filters, beam splitters and dielectric layers of high and low refraction indices in the wide spectrum range.
In further stage, the investigations of fundamental character started, dealing with electrical and optical properties of metal films on dielectric substrates and the metal-dielectric film systems. Electric transport phenomena investigated in wide temperature and film thicknesses range took into account both internal and external size effects. Optical investigations permitted to prove the existence of absorption bands dependent on the metal content
The ellipsometric method was applied in the optical studies of metal, dielectric, semiconductor, implanted and organic films. The optical constants, refractive indices and absorption coefficients were determined for the metals, and the refractive indices and the thicknesses for dielectric and organic films. Experimental examinations of rare earth metal oxide films were also carried out. Different fabrication methods of these films were elaborated and their optical, structural, dielectric and electric properties were examined. Metal-insulator-metal structures were prepared to their studies concerning conductivity, thermally stimulated processes, dielectric response, photoconductivity and the complex impedance diagnostics. Appropriate experimen tal techniques were introduced.
The investigations of discontinuous metal films on dielectric substrates were also undertaken, including the application of the effective medium theory to explain their optical and electrical properties and statistical description of inhomogeneous films on the basis of the Mandelbrot law. Some of the results of the above mentioned problems are presented in this volume.
Pro/! Ewa DoHerzewska-Mozrzymas
