• Nie Znaleziono Wyników

AM80814-005

N/A
N/A
Protected

Academic year: 2022

Share "AM80814-005"

Copied!
5
0
0

Pełen tekst

(1)

L-BAND RADAR APPLICATIONS RF & MICROWAVE TRANSISTORS

.310 x . 310 2LFL (S064) hermetically sealed

. REFRACTORY/GOLD METALLIZATION

. EMITTER SITE BALLASTED

. 5:1 VSWR CAPABILITY

. LOW THERMAL RESISTANCE

. INPUT/OUTPUT MATCHING

. OVERLAY GEOMETRY

. METAL/CERAMIC HERMETIC PACKAGE

. P

OUT

= 5.0 W MIN. WITH 8.5 dB GAIN

DESCRIPTION

The AM80814-005 device is a high power Class C transistor specifically designed for L-Band radar pulsed driver applications.

This device is capable of operation over a wide range of pulse widths, duty cycles and tempera- tures and is capable of withstanding 5:1 output VSWR at rated RF conditions. Low thermal re- sistance and computerized automatic wire bonding techniques ensure high reliability and product con- sistency.

The AM80814-005 is supplied in the IMPAC Her- meti c M etal/ Cer amic package with internal Input/Output matching structures.

PIN CONNECTION

BRANDING 80814-5 ORDER CODE

AM80814-005

ABSOLUTE MAXIMUM RATINGS (T case = 25°C)

Symbol Parameter Value Uni t

P

DISS

Power Dissipation* (T

C

≤ 100 ° C) 23 W

I

C

Device Current* 1.0 A

V

CC

Collector-Supply Voltage* 28 V

T

J

Junction Temperature (Pulsed RF Operation) 250 °C

T

STG

Storage Temperature - 65 to +200 °C

R

TH(j-c)

Junction-Case Thermal Resistance* 6.5 ° C/W

*Applies only to rated RF amplifier operation

1. Collector 3. Emitter

2. Base 4. Base

THERMAL DATA

(2)

ELECTRICAL SPECIFICATIONS (T case = 25°C)

Symbol Test Conditi ons

Value

Uni t Min. Typ. Max.

P

OUT

f = 850 — 1400MHz P

IN

= 0.7W V

CC

= 28V 5.0 5.7 — W η c f = 850 — 1400MHz P

IN

= 0.7W V

CC

= 28V 35 40 — % G

P

f = 850 — 1400MHz P

IN

= 0.7W V

CC

= 28V 8.5 9.0 — dB

N ote: Pulse W idth

=

120

µ

S

Duty Cycle

=

4%

STATIC

Symbol Test Conditions

Value Min. Typ. Max. Unit

BV

CBO

I

C

= 1mA I

E

= 0mA 48 — — V

BV

EBO

I

E

= 1mA I

C

= 0mA 3.5 — — V

BV

CER

IC = 5mA R

BE

= 10Ω 48 — — V

I

CES

V

BE

= 0V V

CE

= 28V — — 500 mA

h

FE

V

CE

= 5V I

C

= 250mA 30 — 300 —

DYNAMIC

TYPICAL PERFORMANCE

2 3 4 5 6 7 8

30 35 40 45 50 55 60 65 70 75 80 85 90

800 950 1100 1250 1400

P O W E R

O U T P U T

FREQUENCY (MHz)

C O L L E C T O R

E F F I C

I E N C Y

%

FREQUENCY (MHz)

POWER OUTPUT & COLLECTOR EFFICIENCY vs FREQUENCY

PW = 120 µ S DC = 4%

V

CC

= 28 V P

IN

0.7 0.6

0.5 (Watts)

P

IN

= 0.5, 0.6W

P

IN

= 07W

(3)

TYPICAL INPUT IMPEDANCE

TYPICAL COLLECTOR LOAD IMPEDANCE

P

IN

= 0.7 W V

CC

= 28 V

Normalized to 50 ohms

Z

IN

Z

CL

L

L

H

H IMPEDANCE DATA

Z

IN

Z

CL

FREQ. Z

IN

( Ω ) Z

CL

( Ω ) L = 0.85 GHz 0.22 + j 0.29 0.13 + j 0.15

• = 1.0 GHz 0.21 + j 0.25 0.18 + j 0.18

• = 1.1 GHz 0.19 + j 0.22 0.23 + j 0.17

• = 1.2 GHz 0.18 + j 0.17 0.32 + j 0.16

• = 1.3 GHz 0.17 + j 0.15 0.29 + j 0.02

H = 1.4 GHz 0.16 + j 0.14 0.22 − j 0.06

(4)

All dimensions are in inches.

Substrate material: .025 thick AI2O3

C1 : 100

µ

F Electrolytic Capacitor, 63V C2 : .1

µ

F Ceramic Capacitor C3 : Feedthrough Bypass SC! 712-022

C4 : .6 — 4.5 pF, 2 pls, Johanson Gigatrim Capacitor

C5 : .6 — 4.5 pF, 2 pls, Johanson Gigatrim Capacitor C6 : 100 pF Chip Capacitor

L1 : No. 26 Wire, 4 Turn L2 : No. 26 Wire, 4 Turn

TEST CIRCUIT

(5)

.318/

.306

PACKAGE MECHANICAL DATA

Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.

SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of SGS-THOMSON Microelectonics.

1994 SGS-THOMSON Microelectronics - All Rights Reserved

SGS-THOMSON Microelectronics GROUP OF COMPANIES

Australia - Brazil - France - Germany - Hong Kong - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands - Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A

Cytaty

Powiązane dokumenty

3 illustrat the differences in the average number of incorrectly diagnosed cases by neural networks with the use of models 1 and

This creates a design challenge for both the luminance efficiency of the phosphor and electrodes (high power efficiency and dissipate heat generated). The VFD HUD implemented rare

Analysis of the index only in terms of its total value does not provide a warning about the productivity increasing at the cost of product

The purpose of this section is to develop the method of proof of Theorem 2 and prove the following theorem..

According to the new rules, we will have the following model of careers in the world of science and academia: after many years of college and university training, after obtaining a

Section 5 is devoted to an application of the inequality (1.4) to a special version of the XVIth Hilbert problem about the number of limit cycles for polynomial planar vector

This paper aimed at validating a specific device dedicated for the measurement of the bearing friction torque of bearings mounted in a wheel hub, in order to explore the

There are striking similarities between the structure of minor patterns for interval maps and the structure of primary patterns for the maps of the triod Y (see [ALM Y ]) which fix