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ne>.

20 STERN AVE.

SPRINGFIELD, NEW JERSEY 07081

U.SA

TELEPHONE: (973) 376-2922 (212)227-6005 FAX: (973) 376-8960

2N6784

2.25A, 200V, 1.500 Ohm, N-Channel Power MOSFET

The 2N6784 is an N-Channel enhancement mode silicon gate power MOS field effect transistor designed for applications such as switching regulators, switching converters, motor drivers, relay drivers, and drivers for high power bipolar switching transistors requiring high speed and low gate drive power. This type can be operated directly from integrated circuits.

Ordering Information

PART NUMBER 2N6784

PACKAGE TO-205AF

BRAND 2N6784 NOTE: When ordering, use the entire part number.

Features

• 2.25A, 200V

• SOA is Power Dissipation Limited

• Nanosecond Switching Speeds

• Linear Transfer Characteristics

• High Input Impedance

• Majority Carrier Device

Symbol

Packaging

JEDEC TO-205AF

DRAIN-

(CASE) SOURCE

GATE

N.I Semi-Conductors reserves the right to change lest conditions, parameter limits and package dimensions without notice.

Information- furnished by NJ Semi-Conductors is believed to be both accurate and reliable at the time of going topress However NJ Semi-Conductors assuntes no responsibility tor any errors or omissions discovered in its use. NJ Semi-Conductors encourages customers to vcrit'v that datasheets iire current before placing orders.

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Absolute Maximum Ratings Tc - 25°C. Unless Otherwise Specified

Drain to Source Breakdown Voltage (Note 1) Vrjs Drain to Gate Voltage (RGS = 20kii) (Note 1) VDGR

Continuous Drain Current ID Tc = 100°C

Pulsed Drain Current (Note 3) IDM Gate to Source Voltage VQS Continuous Source Current (Body Diode) Is Pulse Source Current (Body Diode) ISM Maximum Power Dissipation PD Linear Derating Factor

Operating and Storage Temperature Tj TSTG Maximum Temperature for Soldering

Leads at 0.063in (1.6mm) from Case for 10s T|_

Package Body for 10s, See Techbrief 334 Tpkg

2N6784 200 200 2.25 1.5

9

±20 2.25 9 15 0.12 -55 to 150

300 260

UNITS V V A A A V A A W W/°C

°C

°c °c

CAUTION: Stresses above those listed in "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress only rating and operation oi the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.

NOTE:

1. Tj = 25°Cto125°C.

Electrical Specifications Tc = 25°C, Unless Otherwise Specified PARAMETER

Drain to Source Breakdown Voltage Gate to Threshold Voltage Zero Gate Voltage Drain Current

On-State Drain Current (Note 2) Gate to Source Leakage Current i Drain to Source On Resistance (Note 2) i

Diode Forward Voltage

Forward Transconductance (Note 2) Turn-On Delay Time

Rise Time

Turn-Off Delay Time Fall Time

Input Capacitance Output Capacitance

Reverse Transfer Capacitance Thermal Resistance Junction to Case Thermal Resistance Junction to Ambient

SYMBOL BVDSS VGS(TH)

toss

VDS(ON)

!GSS

rDS(ON)

VSD 9fs td(ON)

tr td(OFF)

tf

CISS

COSS

CRSS

Rejc RBJA

TEST CONDITIONS ID = 0.25mA, VGS = 0V

VGS = VDS. ID = ° 5mA

VDS = 200V, VGS = °v

VDS = 160V, VGS = °V, Tc = 125°C ID = 2.25A, VGS = 10V

VGS = ±20V

ID=1.5A,VG S=10V.TA = 25°C ID = 1 .5A, VGS = 10V. TA = 125°C ls = 2.25A, VGS = 0V

VDS = 5V,ID = 1.5A

VDD = 75V, ID = 1 .5A, RG = son (Figure 1 7) MOSFET Switching Times are Essentially Independent of Operating Temperature

VDS = 25V. VGS = 0V, f = 1 MHz (Figure 1 4)

Free Air Operation

MIN 200 2 - - - - - - 0.7 0.9 - - - - 60 20 5 - -

TYP - - - - - - 1.0

- - 1.3

- - 135

60 16 - -

MAX - 4 250 1000 3.37

±100 1.500

2.81 1.5 2.7 15 20 30 20 200 80 25 8.33

175

UNITS V

v

HA HA V nA

fi ii V S ns ns ns ns PF pF PF

°C/W

°C/W Source to Drain Diode Specifications

PARAMETER Reverse Recovery Time Reverse Recovered Charge

SYMBOL

<rr

QRR

TEST CONDITIONS MIN Tj = 150°C, ISD = 2.25A. dlsD/dt= 100A/jis

Tj = 1 50°C, ISD = 2.25A, dlso/dt = 1 0OA/^is ( - TYP

290 2.0

MAX

-

UNITS ~]

ns

nc |

NOTES:

2. Pulse test: pulse width < SOOfis, duty cycle < 2%.

3. Repetitive rating: pulse width limited by maximum junction temperature. See Transient Thermal impedance curve (Figure 3).

Cytaty

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