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MOS FIELD EFFECT TRANSISTOR

2SK3060

SWITCHING

N-CHANNEL POWER MOS FET INDUSTRIAL USE

DESCRIPTION

The 2SK3060 is N-Channel MOS Field Effect Transistor designed for high current switching applications.

FEATURES

• Low on-state resistance

RDS(on)1 = 13 mΩ MAX. (VGS = 10V, ID = 35A) RDS(on)2 = 20 mΩ MAX. (VGS = 4.0V, ID = 35A)

• Low Ciss: Ciss = 2400pF TYP.

• Built-in gate protection diode

ABSOLUTE MAXIMUM RATINGS (T

A

= 25 °C)

Drain to Source Voltage (VGS = 0 V) VDSS 60 V Gate to Source Voltage (VDS = 0 V) VGSS(AC) ±20 V Gate to Source Voltage (VDS = 0 V) VGSS(DC) +20, −10 V

Drain Current (DC) ID(DC) ±70 A

Drain Current (Pulse) Note1 ID(pulse) ±210 A Total Power Dissipation (TC = 25°C) PT 70 W Total Power Dissipation (TA = 25°C) PT 1.5 W

Channel Temperature Tch 150 °C

Storage Temperature Tstg –55 to +150 °C

Single Avalanche Current Note2 IAS 35 A

Single Avalanche Energy Note2 EAS 122.5 mJ

Notes 1. PW ≤ 10 µs, Duty cycle ≤ 1%

2. Starting Tch = 25°C, VDD = 30 V, RG = 25 Ω, VGS = 20 V → 0 V

ORDERING INFORMATION

PART NUMBER PACKAGE

2SK3060 TO-220AB

2SK3060-S TO-262

2SK3060-ZJ TO-263

2SK3060-Z TO-220SMDNote Note This package is produced only in Japan.

(TO-220AB)

(TO-262)

(TO-263, TO-220SMD)

(2)

ELECTRICAL CHARACTERISTICS (T

A

= 25°C)

CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

RDS(on)1 VGS = 10V, ID = 35A 11 13 mΩ

Drain to Source On-state Resistance

RDS(on)2 VGS = 4.0V, ID = 35A 16 20 mΩ

Gate to Source Cut-off Voltage VGS(off) VDS = 10V, ID = 1mA 1.0 1.5 2.0 V

Forward Transfer Admittance | yfs| VDS = 10 V, ID = 35 A 15 50 S

Drain Leakage Current IDSS VDS = 60V, VGS = 0V 10 µA

Gate to Source Leakage Current IGSS VGS = ±20V, VDS = 0V ±10 µA

Input Capacitance Ciss 2400 pF

Output Capacitance Coss 700 pF

Reverse Transfer Capacitance Crss

VDS = 10V VGS = 0V f = 1MHz

280 pF

Turn-on Delay Time td(on) 30 ns

Rise Time tr 600 ns

Turn-off Delay Time td(off) 140 ns

Fall Time tf

ID = 35A VGS = 10V VDD = 30V RG = 10Ω

450 ns

Total Gate Charge QG 50 nC

Gate to Source Charge QGS 7.5 nC

Gate to Drain Charge QGD

ID = 70A VDD = 48V VGS = 10V

18 nC

Body Diode Forward Voltage VF(S-D) IF = 70A, VGS = 0V 1.0 V

Reverse Recovery Time trr 55 ns

Reverse Recovery Charge Qrr

IF = 70A, VGS = 0V

di/dt = 100A/µs 75 nC

TEST CIRCUIT 1 AVALANCHE CAPABILITY

RG = 25 Ω PG. 50 Ω

L

VDD

VGS = 20 → 0 V

BVDSS

IAS

ID

VDS

Starting Tch

VDD

D.U.T.

TEST CIRCUIT 3 GATE CHARGE

TEST CIRCUIT 2 SWITCHING TIME

PG. RG

0 VGS

D.U.T.

RL

VDD

τ = 1 sµ Duty Cycle ≤ 1%

VGS Wave Form

ID Wave Form

VGS 10%

90%

010%

ID

90%

90%

td(on) tr td(off) tf 10%

τ

ID 0

ton toff

PG. 50 Ω

D.U.T.

RL

VDD

IG = 2 mA

(3)

TYPICAL CHARACTERISTICS (T

A

= 25°C)

DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA

TC - Case Temperature - °C

dT - Percentage of Rated Power - %

0 25 50 75 100 125 150 175 200 20

40 60 80 100

TOTAL POWER DISSIPATION vs.

CASE TEMPERATURE

TC - Case Temperature - °C

PT - Total Power Dissipation - W

0 25 50 75 100 125 150 175 200 140

120

100

80

60

40

20

FORWARD BIAS SAFE OPERATING AREA

VDS - Drain to Source Voltage - V

ID - Drain Current - A

1.0

0.1 10 100 1000

1.0 10 100

0.1

100 ms

TC = 25˚C Single Pulse

RDS(on) Limited(@V

GS= 10V) PW

= 10 µs 100µs 10 1 ms

ms

ID(DC)=70 A

DC Dissipation Limited ID(pulse)=210 A

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH

rth(t) - Transient Thermal Resistance - ˚C/W

100

0.01 0.1 1 10 1000 10000

1 m 10 m 100 m 1 10 100 1000

10µ 100µ

Single Pulse

Rth(ch-C)= 1.79 ˚C/W Rth(ch-A)= 83.3 ˚C/W

(4)

FORWARD TRANSFER CHARACTERISTICS

VGS - Gate to Source Voltage - V

ID - Drain Current - A

0.1 1 10 100

0 1 2 3 4 5

Pulsed VDS = 10 V TA = 125˚C

75˚C 25˚C

−25˚C

DRAIN CURRENT vs.

DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

ID - Drain Current - A

0 1.0 1.5 2.0

200 250

0.5

Pulsed

VGS = 10 V

VGS = 4.0 V 150

100

50

FORWARD TRANSFER ADMITTANCE vs.

DRAIN CURRENT

ID - Drain Current - A

| yfs | - Forward Transfer Admittance - S VDS = 10 V

Pulsed

0.1 1.0

1 10 100

10 100

0.1

Tch = −25˚C 25˚C 75˚C 125˚C

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

GATE TO SOURCE VOLTAGE

VGS - Gate to Source Voltage - V

RDS(on) - Drain to Source On-state Resistance - m

0 20

10 30

20 10

Pulsed

ID = 35 A

DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT

ID - Drain Current - A

RDS(on) - Drain to Source On-state Resistance - m

50

1 0.1

75

10 100 1000

0 25

Pulsed

VGS = 10 V VGS = 4.0 V

GATE TO SOURCE CUT-OFF VOLTAGE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

VGS(off) - Gate to Source Cut-off Voltage - V

VDS = 10 V ID = 1 mA

−50 0 50 100 150

0 1.0 2.0

1.5

0.5

(5)

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

RDS(on) - Drain to Source On-state Resistance -m

0 −50 10

0 50 100 150

ID = 35 A 20

40

30 VGS = 4.0 V

10 V

SOURCE TO DRAIN DIODE FORWARD VOLTAGE

1.0

ISD - Diode Forward Current - A

0 1.5

VSD - Source to Drain Voltage - V 0.5

Pulsed

VGS = 10 V

0.1 1 10 100 1000

VGS = 0 V

CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

Ciss, Coss, Crss - Capacitance - pF

10 0.1 100 1000 10000

1 10 100

VGS = 0 V f = 1 MHz Ciss

Coss

Crss

SWITCHING CHARACTERISTICS

ID - Drain Current - A

td(on), tr, td(off), tf - Switching Time - ns

0.1 10 100 1000 10000

1 10 100

VDD = 30 V VGS = 10 V RG = 10 Ω

td(off)

td(on)

tr

tf

REVERSE RECOVERY TIME vs.

DRAIN CURRENT

IF - Drain Current - A

trr - Reverse Recovery Time - ns

di/dt = 100 A / VGS = 0 V

µs

1 0.1 10

1 10 100

1000

100

VGS - Gate to Source Voltage - V

DYNAMIC INPUT/OUTPUT CHARACTERISTICS

QG - Gate Charge - nC

VDS - Drain to Source Voltage - V

0 20 40 60 80

20

10 50

40

30

2 4 6 8

0 VDD = 48 V

30 V 12 V

12 14 16 18

10 ID = 70 A

VDS

VGS

(6)

SINGLE AVALANCHE CURRENT vs.

INDUCTIVE LOAD

L - Inductive Load - H

IAS - Single Avalanche Current - A

1.0 10 100

1 m 10 m

RG = 25 Ω VDD = 30 V VGS = 20 V → 0 V Starting Tch = 25 °C

IAS = 35 A

10µ 100µ

0.1

EAS = 122.5

mJ

SINGLE AVALANCHE ENERGY DERATING FACTOR

Starting Tch - Starting Channel Temperature - ˚C

Energy Derating Factor - %

25 50 75 100

160

140

120

100

80

60

40

20

0 125 150

VDD = 30 V RG = 25 Ω VGS = 20 V → 0 V IAS ≤ 35 A

(7)

PACKAGE DRAWINGS (Unit : mm)

1)TO-220AB (MP-25) 2)TO-262 (MP-25 Fin Cut)

3)TO-263 (MP-25ZJ) 4)TO-220SMD (MP-25Z) Note

EQUIVALENT CIRCUIT

4.8 MAX.

1.Gate 2.Drain 3.Source 4.Fin (Drain) 1 2 3

10.6 MAX.

10.0

3.6±0.2

4

3.0±0.3

1.3±0.2

0.75±0.1

2.54 TYP. 2.54 TYP.

5.9 MIN.6.0 MAX. 15.5 MAX.12.7 MIN.

1.3±0.2

0.5±0.2 2.8±0.2

φ 4.8 MAX.

1.Gate 2.Drain 3.Source 4.Fin (Drain) 1 2 3

(10) 4

1.3±0.2

0.75±0.3

2.54 TYP. 2.54 TYP.

8.5±0.212.7 MIN.

1.3±0.2

0.5±0.2 2.8±0.2

1.0±0.5

(10)

1.4±0.2

1.0±0.5

2.54 TYP. 2.54 TYP.

8.5±0.2

1 2 3

5.7±0.4

4

2.8±0.2

4.8 MAX.

1.3±0.2

0.5±0.2 (0.5R)

(0.8R)

1.Gate 2.Drain 3.Source 4.Fin (Drain) 0.7±0.2

Body Diode Gate

Drain

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage

Note This package is produced only in Japan.

(10)

1.4±0.2

1.0±0.5

2.54 TYP. 2.54 TYP.

8.5±0.2

1 2 3

3.0±0.5

1.1±0.4

4

2.8±0.2

4.8 MAX.

1.3±0.2

0.5±0.2 (0.5R)

(0.8R)

1.Gate 2.Drain 3.Source 4.Fin (Drain) 1.0±0.3

(8)

M8E 00. 4 The information in this document is current as of April, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.

No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.

NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.

Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.

While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features.

NEC semiconductor products are classified into the following three quality grades:

"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below.

Customers must check the quality grade of each semiconductor product before using it in a particular application.

"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots

"Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support)

"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc.

The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application.

(Note)

(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.

(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above).

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