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MOS FIELD EFFECT TRANSISTOR

2SK3113

SWITCHING

N-CHANNEL POWER MOS FET INDUSTRIAL USE

The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.

Not all devices/types available in every country. Please check with local NEC representative for

DESCRIPTION

The 2SK3113 is N-channel DMOS FET device that features a low gate charge and excellent switching characteristic, and designed for high voltage applications such as switching power supply, AC adapter.

FEATURES

•Low On-state resistance

RDS(on) = 4.4Ω MAX. (VGS = 10V, ID = 1.0A)

•Low gate charge

QG = 9 nC TYP. (VDD = 450 V, VGS = 10 V, ID = 2.0 A)

•Gate voltage rating ±30 V

•Avalanche capability ratings

ABSOLUTE MAXIMUM RATINGS (TA = 25°C)

Drain to Source Voltage (VGS = 0 V) VDSS 600 V Gate to Source Voltage (VDS = 0 V) VGSS ±30 V Drain Current (DC) (TC = 25°C) ID(DC) ±2.0 A Drain Current (pulse) Note1 ID(pulse) ±8.0 A Total Power Dissipation (TC = 25°C) PT1 20 W Total Power Dissipation (TA = 25°C) Note2 PT2 1.0 W

Channel Temperature Tch 150 °C

Storage Temperature Tstg –55 to +150 °C

Single Avalanche Current Note3 IAS 2.0 A

Single Avalanche Energy Note3 EAS 2.7 mJ

Notes 1. PW ≤ 10 µs, Duty cycle ≤ 1%

2. On glass epoxy board with 40 × 40 × 1.6 mm

3. Starting Tch = 25°C, VDD = 150 V, RG = 25 Ω, VGS = 20 → 0 V

ORDERING INFORMATION

PART NUMBER PACKAGE

2SK3113 TO-251

2SK3113-Z TO-252

★ (TO-251)

(TO-252)

(2)

ELECTRICAL CHARACTERISTICS (TA = 25°C)

CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Zero Gate Voltage Drain Current IDSS VDS = 600V, VGS = 0V 100 µA

Gate Leakage Current IGSS VGS = ±30V, VDS = 0V ±10 µA

Gate Cut-off Voltage VGS(off) VDS = 10V, ID = 1mA 2.5 3.5 V

Forward Transfer Admittance | yfs| VDS = 10V, ID = 1.0A 0.5 S

Drain to Source On-state Resistance RDS(on) VGS = 10V, ID = 1.0A 3.3 4.4 Ω

Input Capacitance Ciss VDS = 10V 290 pF

Output Capacitance Coss VGS = 0V 60 pF

Reverse Transfer Capacitance Crss f = 1MHz 5 pF

Turn-on Delay Time td(on) VDD = 150V, ID = 1.0A 7 ns

Rise Time tr VGS(on) = 10V 2 ns

Turn-off Delay Time td(off) RG = 10Ω, RL = 10Ω 22 ns

Fall Time tf 9 ns

Total Gate Charge QG VDD = 450V 9 nC

Gate to Source Charge QGS VGS = 10V 2.4 nC

Gate to Drain Charge QGD ID = 2.0A 2 nC

Body Diode Forward Voltage VF(S-D) IF = 2.0A, VGS = 0V 0.9 V

Reverse Recovery Time trr IF = 2.0A, VGS = 0V 0.9 µs

Reverse Recovery Charge Qrr di/dt = 50A/µs 2.0 µC

TEST CIRCUIT 1 AVALANCHE CAPABILITY

RG = 25 Ω PG. 50 Ω

L

VDD VGS = 20 → 0 V

BVDSS

IAS

ID

VDS

Starting Tch VDD

D.U.T.

TEST CIRCUIT 3 GATE CHARGE

TEST CIRCUIT 2 SWITCHING TIME

PG. RG

0 VGS

D.U.T.

RL

VDD

τ = 1 sµ Duty Cycle ≤ 1%

VGS Wave Form

ID Wave Form

VGS

10%

VGS(on) 90%

010%

ID

90%

90%

td(on) tr td(off) tf 10%

τ

ID

0

ton toff

PG. 50 Ω

D.U.T.

RL

VDD

IG = 2 mA

(3)

TYPICAL CHARACTERISTICS (TA = 25°C)

DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA

Tch - Channel Temperature - ˚C

dT - Percentage of Rated Power - %

0 20 40 60 80 100 120 140 160 100

80

60

40

20

0

TC - Case Temperature - ˚C

PT - Total Power Dissipation - W

0 20 40 60 80 100 120 140 160 40

30

20

10

TOTAL POWER DISSIPATION vs.

CASE TEMPERATURE

5 15 25 35

FORWARD BIAS SAFE OPERATING AREA

10 100 1000

ID - Drain Current - A

1

VDS - Drain to Source Voltage - V 100

10

1

0.1

Power Dissipation Limited 100

µs 10 ms

1 ms

100 ms

PW = 10

µs ID(pulse)

ID(DC)

TC = 25˚C Single Pulse

DC

RDS(on) Limited

(@V

GS = 20 V)

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH

rth(t) - Transient Thermal Resistance - ˚C/W

100 m 1 10 100 1000

10 m 1 m

100 µ 10 µ

100

10

1

0.1

0.01

Rth(ch-A) = 125˚C/W

Rth(ch-C) = 6.25˚C/W

Single Pulse

(4)

DRAIN CURRENT vs.

DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

ID - Drain Current - A

10 20 30 40

1 3 4

2

00 5

6 V VGS = 10 V

8 V Pulsed

FORWARD TRANSFER CHARACTERISTICS

VGS - Gate to Source Voltage - V

ID - Drain Current - A

15 10

5 00

100

10

1.0

0.1

VDS = 10 V Pulsed Tch = 125˚C

75˚C

Tch = 25˚C

−25˚C

GATE TO SOURCE CUT-OFF VOLTAGE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

VGS(off) - Gate to Source Cut-off Voltage - V

−50 0 50 100 150

5.0

4.0

3.0

2.0

1.0

0

VDS = 10 V ID = 1 mA

FORWARD TRANSFER ADMITTANCE vs.

DRAIN CURRENT

ID - Drain Current - A

| yfs | - Forward Transfer Admittance - S

0.1 1.0 10

0.10.01 1 10

100 VDS = 10 V

Pulsed

Tch = −25˚C 25˚C 75˚C 125˚C

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

GATE TO SOURCE VOLTAGE

10 5

VGS - Gate to Source Voltage - V

RDS (on) - Drain to Source On-state Resistance -

1 0

5 15

0

Pulsed

ID = 2.0 A 1.0 A

2 3 4 6 7

DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT

0.1 1 10

ID - Drain Current - A

RDS(on) - Drain to Source On-state Resistance -

0

VGS = 10 V 20 V

Pulsed

1 2 3 4 5 6 7

(5)

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

CHANNEL TEMPERATURE

50 150

RDS (on) - Drain to Source On-state Resistance -

2

0

0 100

−50

Tch - Channel Temperature - ˚C 3

1

VGS = 10 V 4

6 1 A 7

5 8 9

ID = 2 A

SOURCE TO DRAIN DIODE FORWARD VOLTAGE

VSD - Source to Drain Voltage - V

ISD - Diode Forward Current - A

1.5 1.0

0.5 0

100

10

1.0

0.1

Pulsed 0 V

VGS = 10 V

100 10

1 0.1

10000

1000

100

10

1

CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE

Ciss, Coss, Crss - Capacitance - pF

Ciss

Coss

Crss

VGS = 0 V f = 1 MHz

VDS - Drain to Source Voltage - V

SWITCHING CHARACTERISTICS

0.1 1 10

ID - Drain Current - A

td(on), tr, td(off), tf - Switching Time - ns

100

10

1

0.1

VDD =150V VGS = 10V RG =10 td(off)

td(on)

tf

tr

REVERSE RECOVERY TIME vs.

DRAIN CURRENT

1.0 10 100

trr - Reverse Recovery Time - ns

0.1

ID - Drain Current - A 10000

1000

100

10

di/dt = 50 A/µs VGS = 0 V

QG - Gate Charge - nC

VDS - Drain to Source Voltage - V

0 4 8 12 16

600

400

200

DYNAMIC INPUT/OUTPUT CHARACTERISTICS

VGS - Gate to Source Voltage - V

16 14 12 10 8 6 4 2 0 VDS

ID = 2.0 A

VGS 800

VDD = 450 V 300 V 150 V

(6)

SINGLE AVALANCHE CURRENT vs.

INDUCTIVE LOAD

100 µ 1 m 10 m

100

L - Inductive Load - H

IAS - Single Avalanche Current - A

1.0 10

0.110 µ RG = 25 Ω VDD = 150 V VGS = 20 → 0 V Starting Tch = 25˚C

EAS = 2.7 mJ IAS = 2.0 A

SINGLE AVALANCHE ENERGY DERATING FACTOR

75 125 150

Starting Tch - Starting Channel Temperature - ˚C

Energy Derating Factor - %

50 100

25

VDD = 150 V RG = 25 Ω VGS = 20 → 0 V IAS ≤ 2.0 A

0 20 40 60 80 100 120

(7)

PACKAGE DRAWINGS (Unit: mm)

1) TO-251 (MP-3) 2) TO-252 (MP-3Z)

1.Gate 2.Drain 3.Source 4.Fin (Drain) 2

1 3

6.5±0.2 5.0±0.2 4

1.5-0.1+0.2 5.5±0.27.0 MAX. 13.7 MIN.

2.3 2.3

0.75

0.5±0.1 2.3±0.2

1.6±0.2

1.1±0.2

0.5-+0.20.1

0.5-+0.20.1

1. Gate 2. Drain 3. Source 4. Fin (Drain) 1 2 3

4 6.5±0.2 5.0±0.2

4.3 MAX.0.8

2.3 2.3 0.9 MAX.

5.5±0.2 10.0 MAX.

2.0 MIN.

1.5-0.1+0.2 2.3±0.2 0.5±0.1

0.8 MAX.

0.8 1.0 MIN. 1.8 TYP.0.7

1.1±0.2

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD. When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.

EQUIVALENT CIRCUIT

Source Body Diode

Gate Protection Diode Gate

Drain

(8)

The information in this document is current as of january, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.

No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.

NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.

Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.

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NEC semiconductor products are classified into the following three quality grades:

"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below.

Customers must check the quality grade of each semiconductor product before using it in a particular application.

"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots

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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc.

The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application.

(Note)

(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.

(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above).

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