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MOS FIELD EFFECT TRANSISTOR

2SK3061

SWITCHING

N-CHANNEL POWER MOS FET INDUSTRIAL USE

DESCRIPTION

The 2SK3061 is N-Channel MOS Field Effect Transistor designed for high current switching applications.

FEATURES

• Low on-state resistance

RDS(on)1 = 8.5 mΩ MAX. (VGS = 10V, ID = 35A) RDS(on)2 = 12 mΩ MAX. (VGS = 4.0V, ID = 35A)

• Low Ciss: Ciss = 5200pF TYP.

• Built-in gate protection diode

• Isolated TO-220 package

ABSOLUTE MAXIMUM RATINGS (T

A

= 25°C)

Drain to Source Voltage (VGS = 0 V) VDSS 60 V Gate to Source Voltage (VDS = 0 V) VGSS(AC) ±20 V Gate to Source Voltage (VDS = 0 V) VGSS(DC) +20, –10 V Drain Current (DC) (TC = 25°C) ID(DC) ±70 A Drain Current (pulse) Note1 ID(pulse) ±280 A

Total Power Dissipation (TC = 25°C) PT1 35 W

Total Power Dissipation (TA = 25°C) PT2 2.0 W

Channel Temperature Tch 150 °C

Storage Temperature Tstg –55 to +150 °C

Single Avalanche Current Note2 IAS 35 A

Single Avalanche Energy Note2 EAS 122.5 mJ

Notes 1. PW ≤ 10 µs, Duty Cycle ≤ 1%

2. Starting Tch = 25°C, VDD = 30 V, RG = 25Ω, VGS = 20 → 0 V

ORDERING INFORMATION

PART NUMBER PACKAGE

2SK3061 Isolated TO-220

(Isolated TO-220)

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2

ELECTRICAL CHARACTERISTICS (T

A

= 25°C)

CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Zero Gate Voltage Drain Current IDSS VDS = 60 V, VGS = 0 V 10 µA

Gate Leakage Current IGSS VGS = ±20 V, VDS = 0 V ±10 µA

Gate Cut-off Voltage VGS(off) VDS = 10 V, ID = 1 mA 1.0 1.5 2.0 V

Forward Transfer Admittance | yfs| VDS = 10 V, ID = 35 A 20 87 S

Drain to Source On-state Resistance RDS(on)1 VGS = 10 V, ID = 35 A 6.3 8.5 mΩ

RDS(on)2 VGS = 4.0 V, ID = 35 A 8.2 12 mΩ

Input Capacitance Ciss VDS = 10 V 5200 pF

Output Capacitance Coss VGS = 0 V 1300 pF

Reverse Transfer Capacitance Crss f = 1 MHz 480 pF

Turn-on Delay Time td(on) ID = 35 A 75 ns

Rise Time tr VGS = 10 V 1150 ns

Turn-off Delay Time td(off) VDD = 30 V 360 ns

Fall Time tf RG = 10 Ω 480 ns

Total Gate Charge QG ID = 70 A 95 nC

Gate to Source Charge QGS VDD = 48 V 13 nC

Gate to Drain Charge QGD VGS = 10 V 30 nC

Body Diode Forward Voltage VF(S-D) IF = 70 A, VGS = 0 V 0.97 V

Reverse Recovery Time trr IF = 70 A, VGS = 0 V 70 ns

Reverse Recovery Charge Qrr di/dt = 100 A/µs 140 nC

TEST CIRCUIT 1 AVALANCHE CAPABILITY

RG = 25 Ω 50 Ω PG.

L

VDD

VGS = 20 → 0 V

BVDSS

IAS

ID

VDS

Starting Tch

VDD

D.U.T.

TEST CIRCUIT 3 GATE CHARGE

TEST CIRCUIT 2 SWITCHING TIME

PG. RG

0 VGS

D.U.T.

RL

VDD

τ = 1 sµ Duty Cycle ≤ 1%

VGS Wave Form

ID Wave Form

VGS

10%

90%

010%

ID

90%

90%

td(on) tr td(off) tf 10%

τ

ID

0

ton toff

PG. 50 Ω

D.U.T.

RL

VDD

IG = 2 mA

(3)

TYPICAL CHARACTERISTICS (T

A

= 25°C)

DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA

TC - Case Temperature - °C

dT - Percentage of Rated Power - %

0 20 40 60 80 100 120 140 160

20 40 60 80 100

TOTAL POWER DISSIPATION vs.

CASE TEMPERATURE

TC - Case Temperature - °C

PT - Total Power Dissipation - W

0 20 40 60 80 100 120 140 160

70 60 50 40 30 20 10

FORWARD BIAS SAFE OPERATING AREA

ID - Drain Current - A

VDS - Drain to Source Voltage - V 1

10 100

0.1 1 10

TC = 25˚C Single Pulse 0.1

100

Power Dissipation Limited

RDS(on)

LimitedID(DC)

ID(pulse) PW = 10 µs 10 ms 1 ms

DC

1000

100 µs 100 ms

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH

- Transient Thermal Resistance - ˚C/W

10

0.01 0.1 1 100 1000

Rth(ch-C)= 3.57 ˚C/W Rth(ch-A)= 62.5 ˚C/W

(4)

4

FORWARD TRANSFER CHARACTERISTICS

VGS - Gate to Source Voltage - V

ID - Drain Current - A

0.1 1 10 100

0 1 2 3 4 5

Pulsed VDS = 10 V TA = 125˚C

75˚C 25˚C

−25˚C

DRAIN CURRENT vs.

DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

ID - Drain Current - A

0 2 3 4

200

1

Pulsed

VGS = 10 V

VGS = 4.0 V

100

FORWARD TRANSFER ADMITTANCE vs.

DRAIN CURRENT

ID - Drain Current - A

| yfs | - Forward Transfer Admittance - S VDS = 10 V

Pulsed

0.1 1.0

1 10 100

10 100

Tch = −25˚C 25˚C 75˚C 125˚C

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

GATE TO SOURCE VOLTAGE

VGS - Gate to Source Voltage - V

RDS(on) - Drain to Source On-state Resistance - mΩ

0 5

20

10 30

10 15

Pulsed

ID = 35 A

DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT

ID - Drain Current - A

RDS(on) - Drain to Source On-state Resistance - mΩ

1 0.1

30

10 100

0 10 20

Pulsed

10 V VGS = 4.0 V

GATE CUT-OFF VOLTAGE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

VGS(off) - Gate Cut-off Voltage - V

VDS = 10 V ID = 1 mA

−50 0 50 100 150

0 1.0 2.0

1.5

0.5

(5)

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

RDS(on) - Drain to Source On-state Resistance -mΩ

0 −50 5

0 50 100 150

ID = 35 A 10

20

15

VGS = 4.0 V

10 V

SOURCE TO DRAIN DIODE FORWARD VOLTAGE

VSD - Source to Drain Voltage - V

ISD - Diode Forward Current - A

0.1

0 1 10 100

0.5

Pulsed

1 1.5

0 V VGS = 4.0 V

CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

Ciss, Coss, Crss - Capacitance - pF

0.1 0.1 1 10 100

1 10 100

VGS = 0 V f = 1 MHz

Ciss

Coss

Crss

SWITCHING CHARACTERISTICS

ID - Drain Current - A

td(on), tr, td(off), tf - Switching Time - ns

0.1 10 100 1000 10000

1 10 100

VDS = 30 V VGS = 10 V RG = 10 Ω

td(off)

td(on)

tr

tf

REVERSE RECOVERY TIME vs.

DRAIN CURRENT

trr - Reverse Recovery Time - ns

di/dt = 100 A / VGS = 0 V

µs

1 0.1 10

1 10 100

1000

100

VGS - Gate to Source Voltage - V

DYNAMIC INPUT/OUTPUT CHARACTERISTICS

VDS - Drain to Source Voltage - V

0 25 50 75 100

20 40 60 80

2 4 6 8

0 VDD = 12 V

30 V 48 V

12 14 16

10 ID = 70 A VGS = 10 V

(6)

6

SINGLE AVALANCHE CURRENT vs.

INDUCTIVE LOAD

L - Inductive Load - H

IAS - Single Avalanche Current - A

1.0 10 100

1 m 10 m

RG = 25 Ω VDD = 30 V VGS = 20 → 0 V Starting Tch = 25°C

IAS = 35 A

10µ 100µ

0.1

EAS = 122.5

mJ

SINGLE AVALANCHE ENERGY DERATING FACTOR

Starting Tch - Starting Channel Temperature - ˚C

Energy Derating Factor - %

25 50 75 100

160 140 120 100 80 60 40 20

0 125 150

VDD = 30 V RG = 25 Ω VGS = 20 → 0 V IAS ≤ 35 A

(7)

PACKAGE DRAWING (Unit: mm)

10.0 ± 0.3

3.2 ± 0.2 φ 4.5 ± 0.2

2.7 ± 0.2

2.5 ± 0.1 0.65 ± 0.1 1.5 ± 0.2

2.54 1.3 ± 0.2

2.54 0.7 ± 0.1

4 ± 0.2

15.0 ± 0.3 12.0 ± 0.2

3 ± 0.1

1 2 3

1.Gate 2.Drain 3.Source

13.5MIN.

Isolated TO-220 (MP-45F)

Body Diode

Source (S) Drain (D)

Gate (G)

EQUIVALENT CIRCUIT

Gate Protection Diode

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD.

When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.

(8)

M8E 00. 4

The information in this document is current as of April, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.

No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.

NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.

Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.

While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features.

NEC semiconductor products are classified into the following three quality grades:

"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below.

Customers must check the quality grade of each semiconductor product before using it in a particular application.

"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots

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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc.

The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application.

(Note)

(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.

(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above).

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