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MOS FIELD EFFECT TRANSISTOR

2SJ598

SWITCHING

P-CHANNEL POWER MOS FET

The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version.

Not all devices/types available in every country. Please check with local NEC representative for availability and additional information.

DESCRIPTION

The 2SJ598 is P-channel MOS Field Effect Transistor designed for solenoid, motor and lamp driver.

FEATURES

• Low on-state resistance:

RDS(on)1 = 130 mΩ MAX. (VGS = –10V, ID = –6A) RDS(on)2 = 190 mΩ MAX. (VGS = –4.0V, ID = –6 A)

• Low Ciss: Ciss = 720 pF TYP.

• Built-in gate protection diode

• TO-251/TO-252 package

ABSOLUTE MAXIMUM RATINGS (T

A

= 25°C)

Drain to Source Voltage (VGS = 0V) VDSS –60 V Gate to Source Voltage (VDS = 0V) VGSS m20 V Drain Current (DC) (TC = 25°C) ID(DC) m12 A Drain Current (pulse) Note1 ID(pulse) m30 A Total Power Dissipation (TC = 25°C) PT 23 W Total Power Dissipation(TA = 25°C) PT 1.0 W

Channel Temperature Tch 150 °C

Storage Temperature Tstg –55 to +150 °C

Single Avalanche Current Note2 IAS –12 A

Single Avalanche Energy Note2 EAS 14.4 mJ

Notes 1. PW ≤ 10 µs, Duty cycle ≤ 1%

2. Starting Tch = 25°C, VDD = –30 V, RG = 25 Ω, VGS = –20 → 0 V

ORDERING INFORMATION

PART NUMBER PACKAGE

2SJ598 TO-251

2SJ598-Z TO-252

(TO-251)

(TO-252)

(2)

ELECTRICAL CHARACTERISTICS (T

A

= 25°C)

CHARACTERISTICS SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT

Zero Gate Voltage Drain Current IDSS VDS = –60V, VGS = 0V –10 µA

Gate Leakage Current IGSS VGS = m16V, VDS = 0V m10 µA

Gate Cut-off Voltage VGS(off) VDS = –10V, ID = –1mA –1.5 –2.0 –2.5 V

Forward Transfer Admittance | yfs| VDS = –10V, ID = –6A 5 11 S

Drain to Source On-state Resistance RDS(on)1 VGS = –10V, ID = –6A 102 130 mΩ

RDS(on)2 VGS = –4.0V, ID = –6A 131 190 mΩ

Input Capacitance Ciss VDS = –10V 720 pF

Output Capacitance Coss VGS = 0V 150 pF

Reverse Transfer Capacitance Crss f = 1MHz 50 pF

Turn-on Delay Time td(on) ID = –6A 7 ns

Rise Time tr VGS = –10V 4 ns

Turn-off Delay Time td(off) VDD = –30V 35 ns

Fall Time tf RG = 0Ω 10 ns

Total Gate Charge QG ID = –12A 15 nC

Gate to Source Charge QGS VDD= –48V 3 nC

Gate to Drain Charge QGD VGS = –10V 4 nC

Body Diode Forward Voltage VF(S-D) IF = 12A, VGS = 0V 0.98 V

Reverse Recovery Time trr IF = 12A, VGS = 0V 50 ns

Reverse Recovery Charge Qrr di/dt = 100A/µs 100 nC

TEST CIRCUIT 1 AVALANCHE CAPABILITY

RG = 25 Ω PG 50 Ω

L

VDD

VGS = –20 → 0 V

BVDSS

IAS

ID

VDS

Starting Tch

VDD

D.U.T.

TEST CIRCUIT 3 GATE CHARGE

TEST CIRCUIT 2 SWITCHING TIME

PG. RG

0 VGS (−)

D.U.T.

RL

VDD

τ = 1 sµ Duty Cycle ≤ 1%

VGS Wave Form

VDS Wave Form

VGS (−) 10%

VGS 90%

0 10%

VDS (−)

90%

90%

td(on) tr td(off) t f 10%

τ

VDS

0

ton toff

PG. 50 Ω

D.U.T.

RL

VDD

IG = −2 mA

(3)

TYPICAL CHARACTERISTICS (T

A

= 25°C )

TC - Case Temperature - ˚C

PT - Total Power Dissipation - W

0 20 40 60 80 100 120 140 160 TOTAL POWER DISSIPATION vs.

CASE TEMPERATURE 30

25

20

15

10

5

0

FORWARD BIAS SAFE OPERATING AREA

ID - Drain Current - A

VDS - Drain to Source Voltage - V –1

–10 –100

–0.1 –1 –10

TC = 25˚C Single Pulse –0.1

–100

Power D issipation Lim

ited RDS(

on) Lim ited ID(DC)

ID(pulse) PW = 10 µs 100

µs 1 m 10 ms s DC

DERATING FACTOR OF FORWARD BIAS SAFE OPERATING AREA

TC - Case Temperature - ˚C

dT - Percentage of Rated Power - %

0 20 40 60 80 100 120 140 160 100

80

60

40

20

0

TRANSIENT THERMAL RESISTANCE vs. PULSE WIDTH

rth(t) - Transient Thermal Resistance - ˚C/W

10

0.01 0.1 1 100 1000

1 m 10 m 100 m 1 10 100 1000

Single Pulse

10 100

Rth(ch-C) = 5.43˚C/W

µ µ

Rth(ch-A) = 125˚C/W

(4)

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

GATE TO SOURCE VOLTAGE

VGS - Gate to Source Voltage - V

RDS(on) - Drain to Source On-state Resistance - mΩ

0 –5 –10 –15 –20

Pulsed 200

150

100

50

0

ID = –6 A FORWARD TRANSFER CHARACTERISTICS

VGS - Gate to Source Voltage - V

ID - Drain Current - A

Pulsed

–1 –2 –3 –4 –5

VDS = –10 V –10

–1

–0.1 –100

TA = −55˚C 25˚C 75˚C 150˚C

–0.01

DRAIN TO SOURCE ON-STATE RESISTANCE vs. DRAIN CURRENT

ID - Drain Current - A

RDS(on) - Drain to Source On-state Resistance - mΩ

–1 –0.1

300

200

100

0

–10 –100

Pulsed

VGS = –4.0 V –4.5 V –10 V

DRAIN CURRENT vs.

DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

ID - Drain Current - A

0 –4 –6 –8

–50

–40

–30

–20

–10

0 –2

Pulsed VGS = –10 V

–10 –4.0 V

FORWARD TRANSFER ADMITTANCE vs.

DRAIN CURRENT

ID - Drain Current - A

| yfs | - Forward Transfer Admittance - S

–0.01 –0.1 –1

10 100

–10 –100

0.1 1

Pulsed VDS = –10 V TA = 150˚C 75˚C 25˚C −50˚C

0.01

GATE CUT-OFF VOLTAGE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

VGS(off) - Gate Cut-off Voltage - V

VDS = –10 V ID = –1 mA

–1.0 –2.0 –3.0

–50 0 50 100

0 150

–4.0

(5)

DRAIN TO SOURCE ON-STATE RESISTANCE vs.

CHANNEL TEMPERATURE

Tch - Channel Temperature - ˚C

RDS(on) - Drain to Source On-state Resistance - mΩ

−50 0 50 100 150

ID = –6 A 300

250

200

150

100

50

0

–10 V VGS = –4.0 V Pulsed

SOURCE TO DRAIN DIODE FORWARD VOLTAGE

–1.0

ISD - Diode Forward Current - A

0 –1.5

VSD - Source to Drain Voltage - V –0.5

Pulsed

–0.01 –0.1 –1 –10 –100

0 V VGS = –10 V

DYNAMIC INPUT/OUTPUT CHARACTERISTICS

VGS - Gate to Source Voltage - V

QG - Gate Charge - nC

VDS - Drain to Source Voltage - V

0 2 4 6 8 10 12 14 16

–60

–50

–40

–30

–20

–10

0

VDS

VGS

VDD = –48 V –30 V –12 V

ID = –12 A –12 –10

–8

–6

–4

–2

0 REVERSE RECOVERY TIME vs.

DRAIN CURRENT

IF - Drain Current - A

trr - Reverse Recovery Time - ns

di/dt = 100 A/ s VGS = 0 V

1 0.1 10

1 10 100

1000

100

µ CAPACITANCE vs. DRAIN TO SOURCE VOLTAGE

VDS - Drain to Source Voltage - V

Ciss, Coss, Crss - Capacitance - pF

10 100 1000 10000

–0.1 –1 –10

VGS = 0 V f = 1 MHz

Coss

Crss

Ciss

–100

SWITCHING CHARACTERISTICS

ID - Drain Current - A

td(on), tr, td(off), tf - Switching Time - ns

10

1

–1 –0.1

100 1000

–10 –100

tf

tr

td(on)

td(off)

VDD = –30 V RG = 0 Ω VGS = –10 V

(6)

SINGLE AVALANCHE ENERGY DERATING FACTOR

Starting Tch - Starting Channel Temperature - ˚C

Energy Derating Factor - %

25 50 75 100

160 140 120 100 80 60 40 20

0 125 150

VDD = –30 V RG = 25 Ω VGS = –20 → 0 V IAS ≤ –12 A SINGLE AVALANCHE CURRENT vs.

INDUCTIVE LOAD

L - Inductive Load - H

IAS - Single Avalanche Current - A

–1 –10 –100

1 m 10 m

VDD = –30 V RG = 25 Ω VGS = –20 → 0V

IAS = –12 A

10µ 100µ

–0.1

EAS = 14.4 mJ

(7)

PACKAGE DRAWINGS (Unit : mm)

1) TO-251 (MP-3)

1.Gate 2.Drain 3.Source 4.Fin (Drain) 2

1 3

6.5±0.2 5.0±0.2 4

1.5-0.1+0.2 5.5±0.27.0 MAX. 13.7 MIN.

2.3 2.3

0.75

0.5±0.1 2.3±0.2

1.6±0.2

1.1±0.2

0.5-+0.20.1

0.5-+0.20.1

2) TO-252 (MP-3Z)

1. Gate 2. Drain 3. Source 4. Fin (Drain)

1 2 3

4 6.5±0.2 5.0±0.2

4.3 MAX.0.8

2.3 2.3 0.9 MAX.

5.5±0.2 10.0 MAX.

2.0 MIN.

1.5-0.1+0.2 2.3±0.2 0.5±0.1

0.8 MAX.

0.8 1.0 MIN. 1.8 TYP.0.7

1.1±0.2

EQUIVALENT CIRCUIT

Source Body Diode

Gate Protection Diode Gate

Drain

Remark The diode connected between the gate and source of the transistor serves as a protector against ESD.

When this device actually used, an additional protection circuit is externally required if a voltage exceeding the rated voltage may be applied to this device.

(8)

M8E 00. 4

The information in this document is current as of August, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information.

No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document.

NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others.

Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information.

While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features.

NEC semiconductor products are classified into the following three quality grades:

"Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below.

Customers must check the quality grade of each semiconductor product before using it in a particular application.

"Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots

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"Specific": Aircraft, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems and medical equipment for life support, etc.

The quality grade of NEC semiconductor products is "Standard" unless otherwise expressly specified in NEC's data sheets or data books, etc. If customers wish to use NEC semiconductor products in applications not intended by NEC, they must contact an NEC sales representative in advance to determine NEC's willingness to support a given application.

(Note)

(1) "NEC" as used in this statement means NEC Corporation and also includes its majority-owned subsidiaries.

(2) "NEC semiconductor products" means any semiconductor product developed or manufactured by or for NEC (as defined above).

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