Features
• This Circuit is Processed in Accordance to MIL-STD-883 and is Fully Conformant Under the Provisions of Paragraph 1.2.1.
• ON-Resistance 100Ω (Max)
• Low Power Consumption (P
D<1.2mW)
• Fast Transition Time (300ns Max)
• Low Charge Injection
• TTL, CMOS Compatible
• Single or Split Supply Operation
Applications
• Battery Operated Systems
• Data Acquisition
• Medical Instrumentation
• Hi-Rel Systems
• Communication Systems
• Automatic Test Equipment
Description
The DG406/883 and DG407/883 monolithic CMOS analog multiplexers are drop-in replacements for the popular DG506A/883 and DG507A/883 series devices. They each include an array of sixteen analog switches, a TTL and CMOS compatible digital decode circuit for channel selec- tion, a voltage reference for logic thresholds, and an ENABLE input for device selection when several multiplex- ers are present.
These multiplexers feature lower signal ON resistance (<100Ω) and faster transition time (t
TRANS<250ns) compared to the DG506A/883 and DG507A/883. Charge injection has been reduced, simplifying sample and hold applications.
The improvements in the DG406 series are made possible by using a high voltage silicon-gate process. An epitaxial layer prevents the latch-up associated with older CMOS technolo- gies. The 44V maximum voltage range permits controlling 30V
P-Psignals when operating with ±15V power supplies.
The sixteen switches are bilateral, equally matched for AC or bidirectional signals. The ON resistance variation with analog signals is quite low over a ±5V analog input range.
Pinouts
Ordering Information
PART NUMBER
TEMP. RANGE
(oC) PACKAGE
PKG.
NO.
DG406AK/883 -55 to 125 28 Ld CERDIP F28.6 DG407AK/883 -55 to 125 28 Ld CERDIP F28.6
DG406/883 (CERDIP) TOP VIEW
DG407/883 (CERDIP) TOP VIEW
V+
NC NC S16 S15 S14 S13 S12 S11 S10 S9 GND NC A3
D
S8 S7 S6 S5
S3
S1 EN A0 A1 A2 V-
S4
S2 28 27 26 25 24 23 22 21 20 19 18 17 16 15 1
2 3 4 5 6 7 8 9 10 11 12 13 14
V+
DB NC S8B S7B S6B S5B S4B S3B S2B S1B GND NC NC
DA
S8A S7A S6A S5A
S3A
S1A EN A0 A1 A2 V-
S4A
S2A 28 27 26 25 24 23 22 21 20 19 18 17 16 15 1
2 3 4 5 6 7 8 9 10 11 12 13 14
April 1997
DG406/883, DG407/883
Single 16-Channel/Differential
8-Channel CMOS Analog Multiplexers
Functional Block Diagrams
DG406 DG407
DG406 TRUTH TABLE
A3 A2 A1 A0 EN ON SWITCH
X X X X 0 None
0 0 0 0 1 1
0 0 0 1 1 2
0 0 1 0 1 3
0 0 1 1 1 4
0 1 0 0 1 5
0 1 0 1 1 6
0 1 1 0 1 7
0 1 1 1 1 8
1 0 0 0 1 9
1 0 0 1 1 10
1 0 1 0 1 11
1 0 1 1 1 12
1 1 0 0 1 13
1 1 0 1 1 14
1 1 1 0 1 15
1 1 1 1 1 16
S1 S2 S3 S4 S5 S6 S7 S8 S9 S10 S11 S12 S13 S14 S15 S16
D
TO DECODER LOGIC CONTROLLING BOTH TIERS OF MUXING
ADDRESS DECODER
1 OF 16 ENABLE
A0 A1 A2 A3 EN
DG407 TRUTH TABLE
A2 A1 A0 EN ON SWITCH PAIR
X X X 0 None
0 0 0 1 1
0 0 1 1 2
0 1 0 1 3
0 1 1 1 4
1 0 0 1 5
1 0 1 1 6
1 1 0 1 7
1 1 1 1 8
Logic “0” = VAL < 0.8V Logic “1” = VAH > 2.4V X = Don’t Care
S2A S3A S4A S5A S6A S7A S8A
S1B S2B S3B S4B S5B S6B S7B S8B
DA
TO DECODER LOGIC CONTROLLING BOTH TIERS OF MUXING
ADDRESS DECODER
1 OF 8 ENABLE
A0 A1 A2 EN
S1A
DB
Absolute Maximum Ratings Thermal Information
Voltages Referenced to V-
V+ . . . +44.0V GND . . . 25V Digital Inputs, VS, VD (Note 1) . . . (V-) -2V to (V+) +2V or 20mA, Whichever Occurs First Current (Any Terminal) . . . 30mA Peak Current, S or D . . . 100mA
(Pulsed 1ms, 10% Duty Cycle Max)
Operating Conditions
Temperature Range . . . -55oC to 125oC
Thermal Resistance (Typical, Note 2)
θ
JA (oC/W)θ
JC (oC/W) CERDIP Package . . . 55 12 Maximum Junction Temperature. . . 150oC Maximum Storage Temperature Range . . . -65oC to 150oCCAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTES:
1. Signals on SX, DX or INX exceeding V+ or V- will be clamped by internal diodes. Limit forward diode current to maximum current ratings.
2. θJA is measured with the component mounted on an evaluation PC board in free air.
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS Devices tested at +VSUPPLY = +15V, -VSUPPLY = -15V, VAL = 0.8V, VAH = 2.4V, Unless Otherwise Specified
PARAMETER SYMBOL CONDITIONS
GROUP A SUB- GROUP
DEVICE TYPE
(NOTE 3) MIN
(NOTE 3)
MAX UNITS Drain-Source ON Resistance rDS(ON) VD = 10V, IS = -10mA
VD = -10V, IS = 10mA (Note 4)
1, 3 All - 90 Ω
2 All - 120 Ω
Matching Between Channels ∆rDS(ON) rDS(ON) Max - rDS(ON) Min (Note 3)
1 All - 15 Ω
Source OFF Leakage Current IS(OFF) VEN = 0V, VS = ±10V, VD = +10V
1 All -0.5 0.5 nA
2, 3 All -50 50 nA
Drain OFF Leakage Current ID(OFF) VEN = 0V, VS = ±10V, VD = +10V
DG406 1 DG406 -1 1 nA
2, 3 -200 200 nA
DG407 1 DG407 -1 1 nA
2, 3 -100 100 nA
Drain ON Leakage Current ID(ON) VS = VD = ±10V
Sequence Each Switch ON (Note 4)
DG406 1 DG406 -1 1 nA
2, 3 -200 200 nA
DG407 1 DG407 -1 1 nA
2, 3 -100 100 nA
Logic High Input Current IAH VA = 2.4V, 15V 1, 2, 3 All -1 1 µA
Logic Low Input Current IAL VEN = 0V, 2.4V, VA = 0V 1, 2, 3 All -1 1 µA
Positive Supply Current ICC VEN = 2.4V, VA = 0V 1 All - 100 µA
2, 3 All - 500 µA
Negative Supply Current IEE 1 All -1 - µA
2, 3 All -10 - µA
Positive Standby Current ICC Standby
VEN = VA = 0V or 5V 1 All - 30 µA
2, 3 All - 75 µA
Negative Standby Current IEE Standby
1 All -1 - µA
2, 3 All -10 - µA
NOTES:
3. The algebraic convention whereby the most negative value is a minimum and the most positive a maximum, is used in this data sheet.
4. Room = 25oC, Cold and Hot = as determined by the operating temperature suffix.
TABLE 1A. ELECTRICAL PERFORMANCE SPECIFICATIONS (SINGLE SUPPLY) Devices tested at +VSUPPLY = +12V, -VSUPPLY = 0V, VAL = 0.8V, VAH = 2.4V, Unless Otherwise Specified
PARAMETER SYMBOL CONDITIONS
GROUP A SUB- GROUP
DEVICE
TYPE MIN MAX UNITS
Drain-Source ON Resistance rDS(ON) VD = 3V, 10V IS = -1mA
1 All - 120 Ω
Positive Current ICC VEN = 0V or 5V,
VA = 0V or 5V
1 All - 30 µA
2, 3 All - 75 µA
Negative Current IEE 1 All -1 - µA
2, 3 All -5 - µA
Switching Time of Multiplexer tTRANS VS1 = 8V, VSS - 0V, VIN = 2.4V
1 All - 450 ns
Enable Turn-ON Time tON(EN) VINH = 2.4V, VINL = 0V,
VS1 = 5V 1 All - 600 ns
Enable Turn-OFF Time tOFF(EN) 1 All - 300 ns
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS
Devices tested at +VSUPPLY = +15V, -VSUPPLY = -15V, VAL = 0.8V, VAH = 2.4V, Unless Otherwise Specified (Continued)
PARAMETER SYMBOL CONDITIONS
GROUP A SUB- GROUP
DEVICE TYPE
(NOTE 3) MIN
(NOTE 3)
MAX UNITS
TABLE 2. AC ELECTRICAL PERFORMANCE SPECIFICATIONS Devices tested at +VSUPPLY = +15V, -VSUPPLY = -15V, VAL = 0.8V, VAH = 2.4V, Unless Otherwise Specified
PARAMETER SYMBOL CONDITIONS
GROUP A SUB- GROUP
DEVICE
TYPE MIN MAX UNITS
Transition Time tTRANS CL = 35pF, RL = 300Ω, See Figure 1
9 All - 300 ns
10, 11 All - 400 ns
Enable Turn-ON Time tON(EN) CL = 35pF, RL = 300Ω, See Figure 2
9 All - 200 ns
10, 11 All - 400 ns
Enable Turn-OFF Time tOFF(EN) 9 All - 150 ns
10, 11 All - 300 ns
Break Before Leakage Current tOPEN CL = 35pF, RL = 300Ω, See Figure 3
9 All 25 - ns
10, 11 All 10 - ns
TABLE 3. DC ELECTRICAL PERFORMANCE SPECIFICATIONS Devices tested at +VSUPPLY = +15V, -VSUPPLY = -15V, VAL = 0.8V, VAH = 2.4V, Unless Otherwise Specified
PARAMETER SYMBOL CONDITIONS NOTE TEMP (oC) MIN TYP MAX UNITS
Off Isolation Time VISO VEN = 0V, RL = 1K, f = 100kHz, GEN = 1VP-P Sine Wave, See Figure 5
5 25 50 - - dB
Charge Transfer Error VCTE CL = 10nF, VS = 0V, RS = 0Ω, See Figure 4
5 25 - - 10 mV
Crosstalk VCT RL = 1K, f = 100kHz,
GEN = 1VP-P Sine Wave, See Figure 5
5 25 50 - - dB
Source OFF Capacitance CS(OFF) VEN = 0V, VS = 0V, f = 1MHz 65 25 - - 10 pF
Drain OFF Capacitance CD(OFF) VEN = 0V, VD = 0V, f = 1MHz
DG406 5 25 - - 200 pF
DG407 5 25 - - 100 pF
Drain ON Capacitance CD(ON) VEN = 0V, VD = 0V, f = 1MHz
DG406 5 25 - - 400 pF
DG407 5 25 - - 200 pF
NOTE:
5. Parameters listed via process parameters and are not directly tested at final production. These parameters are lab characterized upon design release, or upon design changes. These parameters are guaranteed by characterization based upon data from multiple produc- tion rich reflect lot to lot and within lot variation.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn0In) 1
Final Electrical Test Parameters 1 (Note 6), 2, 3, 9, 10, 11
Group A Test Requirements 1, 2, 3, 9, 10, 11
Group C and D Endpoints 1
NOTE:
6. PDA applied to Subgroup 1 only.
Test Circuits and Waveforms
FIGURE 1A. FIGURE 1B.
FIGURE 1C.
FIGURE 1. TRANSITION TIME
FIGURE 2A. FIGURE 2B.
FIGURE 2C.
EN A3
DG406
GND A2 A1
S1 S2 - S15 S16 V- D V+
±
±10V
VO 300Ω 35pF
50Ω
+15V
+2.4V
-
15V A010V
EN
A0 DG407
GND A1 A2
S1B
†
S8B DB V-
V+ ±10V
VO 300Ω 35pF
50Ω
+15V
+2.4V
-
15V†
= S1A - S8A, S2B - S7B, DA± 10V
LOGIC INPUT
SWITCH OUTPUT VO
3V
VS1B
50%
tr < 20ns tf < 20ns
tTRANS 0V 50%
0V VS8B
tTRANS
S8 ON 80%
80%
S1 ON
EN A3
DG406
GND A2 A1
S1 S2 - S16
V- D
V+ -5V
VO 300Ω 35pF
50Ω
+15V
-
15VA0 EN
A0 DG407
GND A1
A2 S1B
†
DB V-
V+ -5V
VO 300Ω 35pF
50Ω
+15V
-
15V†
= S1A - S8A, S2B - S8B, DALOGIC INPUT
SWITCH OUTPUT VO
3V
VO
50%
tr < 20ns tf < 20ns
tON(EN) 0V
50%
tOFF(EN)
90%
0V
FIGURE 2. ENABLE SWITCHING TIME
FIGURE 3A. FIGURE 3B.
FIGURE 3. BREAK-BEFORE-MAKE INTERVAL
FIGURE 4. CHARGE INJECTION
FIGURE 5. OFF ISOLATION FIGURE 6. CROSSTALK
Test Circuits and Waveforms
(Continued)EN A3
DG406
GND A2 A1
ALL S
D, V-
V+ +5V
VO 300Ω 35pF
50Ω
+15V
+2.4V
-
15V A0DG407 AND DA
DB
LOGIC INPUT
SWITCH OUTPUT VO
3V
VD
tr < 20ns tf < 20ns
tOPEN 0V
0V
80%
50%
SX
A0 DG406
GND A1 A2
D
V- V+
VO CL +15V
-
15V A3DG407 EN VGEN = 0-3V
10nF
5V
∆VO OFF OFF
ON 3V
0V LOGIC
INPUT
SWITCH OUTPUT
SX1
A0 DG406
GND A1 A2
D
V- V+
VO RL RG = 50Ω
+15V
-
15V A3DG407 SX16 VGEN = 1VP-P
1kΩ
OFF ISOLATION = 20LOG VOUT VIN EN
VS
A0 DG406
GND A1 A2
D
V- V+
VO RL RG = 50Ω
+15V
-
15V A3DG407 1VP-P
1kΩ EN
S1
1kΩ VS
CROSSTALK = 20LOG VOUT VIN SX2
SX16
Burn-In Circuit
CERDIP BURN-IN SCHEMATIC DG406/407AK/883
NOTE:
R1, R2 = 10kΩ ±5%, 1/2W or 1/4W (Per Socket)
C1, C2 = 0.01µF (Min, Per Socket) or 0.1µF (Min, Per Row) D1, D2 = IN402 (or Equivalent, Per Board)
Schematic Diagram (Typical Channel)
+15V
D1 C1
R1
28 27 26 25 24 23 22 21 20 19 18 17 16 15 1
2 3 4 5 6 7 8 9 10 11 12 13 14
OUT/OUTA -V IN 8/8A IN 7/7A IN 6/6A IN 5/5A IN 4/4A IN 3/3A IN 2/2A IN 1/1A EN A0 A1 A2 A3/NC
VREF GND IN 9/1B IN 10/2B IN 11/3B IN 12/4B IN 13/5B IN 14/6B IN 15/7B IN 16/8B NC NC/OUT B +V
R2
-15V
D2 C2
+5V
V+
GND
A0
AX
EN
V-
VREF
LEVEL
SHIFT DECODE/
DRIVE
V+
V+ V-
D
S1
SN
Typical Design Information
The information contained in this section has been developed through characterization by Harris Semiconductor and is for use as applica- tion and design information only. No guarantee is implied.
Typical Performance Curves
FIGURE 7. rDS(ON) vs VD AND SUPPLY FIGURE 8. rDS(ON) vs VD AND TEMPERATURE
FIGURE 9. rDS(ON) vs VD AND SUPPLY FIGURE 10. ID, IS LEAKAGE CURRENTS vs ANALOG VOLT- AGE
±5V
±10V±8V
±15V±12V
±20V 160 140 120 100 80 60 40 20
0-20 -16 -12 -8 -4 0 4 8 12 16 20
VD, DRAIN VOLTAGE (V)
rDS(ON), ON RESISTANCE (Ω) 125oC
-40oC
-55oC 25oC 85oC
0oC
V+ = 15V V- = -15V 80
70 60 50 40 30 20 10
0-15 -10 -5 0 5 10 15
VD, DRAIN VOLTAGE (V) rDS(ON), ON-RESISTANCE (Ω)
V- = 0V
V+ = 7.5V
10V 12V
15V 20V
22V 240
200
160
120
80
40
00 4 8 12 16 20
VD, DRAIN VOLTAGE (V) rDS(ON), ON-RESISTANCE (Ω)
-10 -5 0 5 10 15
VS, VD, SOURCE DRAIN VOLTAGE (V) V+ = 15V, V- = -15V
VS = -VD FOR ID(OFF) VD = VS(OPEN) FOR ID(ON)
IS(OFF)
DG406 ID(ON), ID(OFF)
-15 120
80
40
0
-40
-80
-120 ID, IS, CURRENT (pA)
DG407 ID(ON), ID(OFF)
FIGURE 11. ID, IS LEAKAGE vs TEMPERATURE FIGURE 12. SWITCHING TIMES vs BIPOLAR SUPPLIES
FIGURE 13. SWITCHING TIMES vs SINGLE SUPPLY FIGURE 14. OFF-ISOLATION vs FREQUENCY
FIGURE 15. SUPPLY CURRENTS vs SWITCHING FREQUENCY FIGURE 16. tON/tOFF vs TEMPERATURE
Typical Performance Curves
(Continued)V+ = 15V, V- = -15V VS OR VD = ±10V
IS(OFF) ID(ON), ID(OFF)
100nA
10nA
1nA
100pA
10pA
1pA
0.1pA ID, IS, CURRENT (A)
-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (oC)
350
300
250
200
150
100
50
05 10 15 20
VSUPPLY, SUPPLY VOLTAGE (±V)
TIME (ns)
tTRANS
tON(EN)
tOFF(EN)
700
600
500
400
300
200
100
05 10 15 20
V+, SUPPLY VOLTAGE (V)
TIME (ns) tTRANS
tON(EN)
tOFF(EN)
V- = 0V
1K 10K 100K 1M 10M
f, FREQUENCY (Hz) 100
-140
-120
-100
-80
-60
-40
-20
ISOL (dB)
0
100 1K 10K 100K 1M 10M
f, FREQUENCY (Hz) EN = 5V, AX = 0V OR 5V
IGND
10 10
8 6
0
-4
-8 -10
I, CURRENT (mA)
I+
I- 4
2
-2
-6
300 280 260 240 220 200
140 120
60-55 -35 -15 5 25 45 65 85 105 125
TEMPERATURE (oC)
TIME (ns)
180 160
100 80
tTRANS
tON(EN)
tOFF(EN) V+ = 15V, V- = -15V
FIGURE 17. SWITCHING THRESHOLD vs SUPPLY VOLTAGE
Typical Performance Curves
(Continued)5 10 15 20
VSUPPLY, SUPPLY VOLTAGE (±V) 00
1 2 3
VA(V)
Die Characteristics
DIE DIMENSIONS:
2490µm x 4560µm x 485µm ±25µm METALLIZATION:
Type: SiAl
Thickness: 12k Å ±1k Å
PASSIVATION:
Type: Nitride
Thickness: 8k Å ±1k Å
WORST CASE CURRENT DENSITY:
9.1 x 10
4A/cm
2Metallization Mask Layout
DG406/883
Die Characteristics
DIE DIMENSIONS:
2490µm x 4560µm x 485µm ±25µm
V-
S16
D
NC V+
S8
A0 EN
S7
S6
S5
S4
S3
S2
S1
A1 A2 A3
GND S15
S14
S13
S12
S11
S10
S9
All Intersil U.S. products are manufactured, assembled and tested utilizing ISO9000 quality systems.
Intersil Corporation’s quality certifications can be viewed at www.intersil.com/design/quality
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design, software and/or specifications at any time without notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
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NOTES:
1. Index area: A notch or a pin one identification mark shall be lo- cated adjacent to pin one and shall be located within the shaded area shown. The manufacturer’s identification shall not be used as a pin one identification mark.
2. The maximum limits of lead dimensions b and c or M shall be measured at the centroid of the finished lead surfaces, when solder dip or tin plate lead finish is applied.
3. Dimensions b1 and c1 apply to lead base metal only. Dimension M applies to lead plating and finish thickness.
4. Corner leads (1, N, N/2, and N/2+1) may be configured with a partial lead paddle. For this configuration dimension b3 replaces dimension b2.
5. This dimension allows for off-center lid, meniscus, and glass overrun.
6. Dimension Q shall be measured from the seating plane to the base plane.
7. Measure dimension S1 at all four corners.
8. N is the maximum number of terminal positions.
9. Dimensioning and tolerancing per ANSI Y14.5M - 1982.
10. Controlling dimension: INCH.
bbb S C A - B
c Q
L SEATING A
BASE
D
PLANE
PLANE
-A- -D-
-C- -B-
α D
E
S1 b2
b A
e
M c1
b1
(c)
(b) SECTION A-A
BASE LEAD FINISH
METAL
eA/2 A
M
S S
ccc M C A - B S DS aaaM C A - B S DS eA
Ceramic Dual-In-Line Frit Seal Packages (CERDIP)
F28.6
MIL-STD-1835 GDIP1-T28 (D-10, CONFIGURATION A) 28 LEAD CERAMIC DUAL-IN-LINE FRIT SEAL PACKAGESYMBOL
INCHES MILLIMETERS
NOTES
MIN MAX MIN MAX
A - 0.232 - 5.92 -
b 0.014 0.026 0.36 0.66 2
b1 0.014 0.023 0.36 0.58 3
b2 0.045 0.065 1.14 1.65 -
b3 0.023 0.045 0.58 1.14 4
c 0.008 0.018 0.20 0.46 2
c1 0.008 0.015 0.20 0.38 3
D - 1.490 - 37.85 5
E 0.500 0.610 12.70 15.49 5
e 0.100 BSC 2.54 BSC -
eA 0.600 BSC 15.24 BSC -
eA/2 0.300 BSC 7.62 BSC -
L 0.125 0.200 3.18 5.08 -
Q 0.015 0.060 0.38 1.52 6
S1 0.005 - 0.13 - 7
α
90o 105o 90o 105o -aaa - 0.015 - 0.38 -
bbb - 0.030 - 0.76 -
ccc - 0.010 - 0.25 -
M - 0.0015 - 0.038 2, 3
N 28 28 8
Rev. 0 4/94