-
---
---~-INTERPRETATION OF GEOELECTRIC
RESISTIVITY CURVES
PROEFSCHRIFT
TER VERKRIJGING VAN DE GRAAD VAN
DOCTOR IN DE TECHNISCHE WETENSCHAP
AAN DE TECHNISCHE HOGESCHOOL TE
DELFT, OP GEZAG VAN DE RECTOR
MAGNI-FICUS Ir. H. j. DE WIJS, HOOGLERAAR IN DE
AFDELING DER MIJNBOUWKUNDE, VOOR
EEN COMMISSIE UIT DE SENAAT TE
VER-DEDIGEN OP WOENSDAG 10 JUNI 1964,
DES VOORMIDDAGS TE 11 UUR
DOOR
F. G. VAN DER HOEVEN
mijnbouwkundig ingenieur
geboren
te Hilversum
l---~" "_.~---~-_."'----.BiBLIOTHEEK
DER
T
ECHNISCHE HOGESCHOOL
DELFT
~ .1"_""- ...DIT PROEFSCHRIFT IS GOEDGEKEURD DOOR DE PROMOTOR
PROF. O. KOEFOED
CONTENTS
Introduction
....
.
. . .
CHAPTER
I
Problems of solving three layer configurations.
Compar-page
9
ison with computed curves, not always practicabie
14
11
The equivalence concept . . . .
15
111
First method for solving the equivalence problem
16
IV Second method for solving the equivalence problem .
25
V
Application of the second method to computed curves.
31
VI
Electronically computed three layer curves.
34
VII
Errors due to latitude with the first cross
37
Conclusion . . . .
Acknowledgements, References .
Annex, with Algol program and computed curves
Abstract . .
Samenvatting
40
40
42
48
48
/
L
el,
dl,
ea
er,
k
V
r
J
a
8
e2
d2
dr
LIST
'
OF SYMBOLS
Distance between current electrodes in SCHLUMBERGER electrode
con-figuration.
Resistivities of subsurface layers.
Thicknesses of subsurface layers.
Apparent resistivity.
Resistivity and thickness
o~
a fictitious replacement layer.
Resistivity factor, defined as
k
n
=
(en+1-en)
I
(en+1 +en).
Voltage difference between potential electrodes.
Distance from current source.
Current through current electrodes.
INTRODUCTION
The purpose of resistivity measurements is, to jnfer subsurface geology from
surface measurements of electrical quantities.
The applications serve several stratigraphic problems. The existence of a
watertable in fill material or more consolidated rock, can be investigated.
Civil engineering problems using the method, may involve examination of
dam and reservoir sites, location of rock and gravel quarries, tunnel
construc-tion, or shallow depth to bedrock mapping. Resistivity measurements, have
been made on ore bodies, coalbeds and salt domes.
With resistivity measurements, a current is passed through the ground, and
potential drop is measured at the surface with two additional electrodes. The
measurements of current and potential drop, give a figure for apparent
resist-ivity (la, of the subsurface using the formula:
V
=
(la· J/2nr.
The term "apparent resistivity" applies to the hypothetical assumption,
that the subsurface is electrically homogeneous, (which generally it is not).
The term apparent resistivity is also used, since it does not mean the resistivity
of any kind of subsurface material, but depends on the electrical resistance,
offered by various subsurface layers, furthermore depending on the depth of
current penetration. Current penetration, primarily increases with the
dis-tance between current electrodes and depends on resistivity contrasts of the
subsurface layers.
For obtaining information on depth and resistivity of these layers, the
appar-ent resistivity is measured and plotted as a function of electrode distance.
The apparent resistivity
(1aapproximates the resistivity value of the surf ace
layer at short electrode distance, (short in relation to the thickness of the
sur-face layer).
A larger electrode spacing gives an apparent resistivity (la, gradually
express-ing more influence of deeper subsurface layers.
In the simple case of a surface layer on a second infinite subsurface layer,
the apparent resistivity graph, has parallel horizontal asymptotes at both ends
of the curve, with values of
(11and
(12,for short and long electrode distances
respectively.
FIG.
1. For measurements, the potential electrodes are placed on
a straight line, connecting the current electrodes.
The SCHLUMBERGER method, uses potential electrodes, placed close together
in re1ation to the distance between the current electrodes and uses half of this
distance
1/2L,
in its graphical representation. (Using
l/2L
as a parameter,
im-proves the resemblance of the computed curves, and the fieldcurve
measure-ments, made with closely spaced potential e1ectrodes.)
The WENNER method, places the four electrodes an equal distance apart
from each other, and uses this distance "a" in its graphical representation.
As aresult, for any given situation, the WENNER curve is practically the same
as the SCHLUMBERGER curve, except for the figures of its electrode distance
axis, bemg a ratio (about
3/4)
smaller for the WENNER curve than for each
iden-tic al point of the SCHLUMBERGER curve. Two layer curves for the
SCHLUM-BERGER arrangement as computed by CGG [1955] Compagnie Générale de la
Géophysique, are given in FIG. 1, while those for the WENNER arrangement,
as computed electronically, are given in FIG. 25.
The interpretation of the resistivity curves requires comparison with
theoret-ical curves, computed for various assumed subsurface configurations. Such
subsurface configurations can then be inferred if they produce the same
anom-alies as those of the observed curve.
A catalog of computed standard curves such as the CGG collection, of 480
curves, can be used for such comparison purposes.
Additional curves, may have to be computed individually for closer
resem-blance. The calculation of resistivity curves however is such a time consuming
process, th at additional interpretation methods are required for application
in the field office.
Since the determination of the surf ace layer requires the use of two-layer
standard curves, such additional interpretation methods are based on the
'
same series of two-layer standard curves, as eXplained m the following chapters.
Computing resistivity curves
For theoretical curves, the subsurface is assumed to consist ofhorizontallayers,
each of them electrically homogeneous, on an infinite bottom layer. A
sub-surface of only th ree layers will be subjected to discussion in this paper.
For computing resistivity curves, the electric field of a layered subsurface is
taken to be caused by the current source itself and by its hypothetical mirrored
images
Qn.
Vertically below the current source, these images are taken as
mirrored through each discontinuity between two layers of contrasting
resist-ivity. The strengths of the images
Qn,
are fractions of the strength
'
of the
current source
(Qo
=
1) itself, depending on the resistivity factor
k
n
=
=
Ü?n+1-en)/(en+1 +en)
of the discontinuity, causing the images. The
con-tribution of each image
Qn,
to the complete current pattern, furthermore
decreases with its depth.
The basic formula
V
=
el·
J/2nr.
is consequently multiplied by a function
composed of a series of images, divided by their depth term:
The use of basic formula and image poles is treated in textbooks on geophysical
exploration. HEILAND [1946].
Three calculating methods
The calculating method as described by KOEFOED [1955] has been
pro-grammed for an electronic computer.
FLATHE [1955] gives a method for calculating resistivity curves and a
similar method has been used by CGG [1955]. With these last two methods,
the resistivity curve is obtained as a combination of many simplified three
layer curves ofwhich
d
2=
dl
and
e3=
0
(i.e.
two differently conducting layers
of equal thickness on a perfectly conducting substratum).
Sincc it is customary to express all resistivities as a multiple of
el,
the function
ea/el
=
(I+F(k, dl,
r))
can be plotted on a graph ofwhich the axes represent
ea/el
=
1 and
1/2L/dl
=
1.
This leads to the use of a bilogarithmic scale, having the advantage th at
resistivity curves retain the same shape and size, even if the surface layers of
the two resistivity curves are different in thickness and resistivity. This can be
eXplained as follows:
If
the thickness of all the subsurface layers, (including dl) and the electrode
di stance would be increased with the same percentage, no difference could be
observed on the resistivity curve except for the figures on the electrode di stance
axis being increased with the same percentage. Similarly, if all resistivities
under consideration, would be multiplied with some other factor, this would
change apparent resistivity
ea
in the same proportion. Such a change in both
units of resistivity and electrode distance on bilogarithmic graph paper, would
simply cause a parallel shift of the curve.
(If multiplication, changes the scale
of the curve on normal graph paper, it merely displaces the curve on
log-arithmic paper).
A
logarithmic scale with a modulus of 62.5 mm has been
used throughout this paper, except for FIG. 3 and FIG. 14.
Two layer standard curves are computed for one single surface layer, on an
infinite substratum of varying resistivity contrast. One set of standard curves
on a single page, suffices for all values of dl, el and
e2,
since the curves are
significant as ratios
1/2L/dl
and
e2/el,
and not only for separately variable dl
and
el.
FIG. land FIG. 25.
Determination
rif the surface layer
until it coincides with a twolayer standard curve or an interpolation thereoff.
The selected two layer standard curve must coincide with the field curve over
the greatest possible length. There is little difference between the standard
curves, of slightly different resistivity contrasts, and the accuracy of the method
depends on the similarity of the selected standard curve and the field curve.
A perfect fit of the standard curve on the field curve, means that the ratios
e2/el
and
d
2
/d
l
of the field curve and the standard curve are identical. The
origin of the standard curve's graph where
1/2L
=
ea
=
I can now be marked
on the field curve's graph, as its "first cross" where the values of
L/2
and
ea
are
determined as
dl
and
el.
;'Ja/iJl
~~~~~---
--
---i~m---%L
---%
---06
FIG.
I
Two layer standard curves on bilogarithmic scale, for the
SCHLUMBERGERelectrode
configuration.
A-B electrode distance
L.
m-n potential electrode distance, generally smaller than
l/.L.
12
If
the second layer is sufficiently thick, a single curve solves
dl, el,
and
d
2of
the field curve. In this case, the standard curve and the field curve are identica
I
up to the point where the third layer's discontinuity can be noticed at large
electrode distance. A perfect fit of the standard curve on the fieldcurve is
difficult to choose however if the second layer is insufficiently thick. The
determination of
el
and
dl,
is hardly affected then, but the choice of
e2
be-comes doubtful, if the fieldcurve can be matched with different standard
curves. Solving the value of
e2
in such cases is the purpose of the following
chapters.
CHAPTER I
PROBLEMS OF SOLVING THREE LAYER CONFIGURATIONS.
COMPARISON WITH COMPUTED CURVES,
IS NOT AL W AYS PRACTICABLE
Of a two layer configuration, the second layer's resistivity can be determined,
by comparison of the field curve with a series of computed two layer curves,
as explained in the introduction.
With a three layer curve the second layer can not easily be determined in
this manner, since the current pattern largely depends on
the
first and the
third layer, even at an advantageous electrode distance.
Unless the second layer's thickness is more than ten times the thickness of
the surf ace layer, th
.
e field curve does not clearly show the resistivity of the
second layer. In this case, the second layer can only be determined if the
field-curve closely resembles a field-curve that is computed from assumed parameters.
For such close resemblance, the necessary number of computed three layer
curves for comparison purposes becomes prohibitive. A complete catalog of
three layer curves would have to range through all possible value combinations
of
e2/e1;
d2
/d1;
es.
Therefore three layer curves can not always be solved by
comparison with computed curves, and another method is needed.
In order to find an alternative to the use of computed curves, it will be tried
to find a characteristic point of the resistivity curve that is independent of
e3.
These points would be taken from a collection of computed curves, and used
for making a graph or diagram, to solve the fieldcurve or sounding graph,
from which the same characteristic point can be determined.
CAGNIARD [1952] uses the so called replacement value of first and second
layer, as such a characteristic point of the curve. This concept of replacement
value for first and second layer, can be eXplained as follows:
At short electrode distance, the current pattern depends on the contrast
between first and second layer. At large electrode distance, this contrast is no
longer of influence on apparent resistivity, and the two upper layers can be
thought to be combined in a so called replacement layer, with its own
replace-ment resistivity
er,
and replacement thickness
fit..
The three layer curve ean be thought to consist of two smoothly joined two
layer curves, each covering one of the two branches of the three layer curve.
The first branch of the three layer curve is determined by the resistivity
contrast between the surface layer and the subsurface layers. The second
branch of the three layer curve is determined by the contrast between the
third layer and its overburden.
The two values for thickness and the two values for resistivity of the two
surface layers, or over-burden, can be given as one replacement thickness
d
r,
and one replacement resistivity
(lr.
The two replacement values can be
given in the form of a graph, since mathematical representation is too
com-plicated.
The replacement values, can be determined, by finding a two layer standard
curve matching the second branch of a computed three layer resistivity curve.
The two replacement values are then given, by the coordinates of the standard
curve's origin or cross. This point is marked on the curve's graph, as the
"second cross", and characterises the resistivity curve, whereupon these points
can be combined in a graph. This graph can then be used for solving the field
curve, of which the replacement values can be determined by matching its
second branch with a standard curve and marking its cross.
CAGNIARD'S
application of the replacement concept, condenses the complete catalogue of
three layer resistivity curves in a few diagrams; a distinct simplification. Three
separate diagrams are made for different values of
(la.
Since the graphs are
largely coincident however it proves to be possible to combine them into one
generalised
CAGNIARD
graph. The me rits of this simplification have heen
published by
KOEFOED
[1960].
CHAPTER II
THE EQUIV ALENCE CONCEPT
Unequivocal interpretation of resistivity curves is difficult because of the
equivalence phenomenon. This phenomenon causes close resemblance between
resistivity curves of widely different bottom configurations.
This confusing resemblance occurs, when tht; total resistance offered by the
second subsurface layer remains the same because of appropriate variations in
d2
and
(l2.
If
(}2
is smaller than (}l
and
(la,
the total resistanceofthe second layer
remains the same, if
(l2/d2
remains constant. If
(}2is larger than
(}land
(la,
the
total resistance of the second layer will be as constant as the product
(l2· d2•
Whenever the tota! resistances of the second layers are identical, the resistivity
curves of such configurations are similar, and it
will be hard to distinguish the
right values for
d2
and
(l2,
the more so if the second layer is not thick.
With
CAGNIARD'S
procedure, the second branch of the field curve can be
matched then with several two layer standard curves, and the position of the
"second cross" is ill defined. Each possible position of the second cross, can be
used for a figure for the product
d2·
(!2,
(or the ratio
d2/
(!2)
and it becomes
necessary to find the value for (!2
in a different manner.
In order to obtain this information, the equivalent curves will have to be
studied for slight differences, in spite of their apparent similarity.
In the following chapters, two methods will be given for solving those cases,
where several configurations have almost identical resistivity curves.
CHAPTER III
FIRST METHOD FOR SOLVING THE EQUIVALENCE PROBLEM
The two curves of
FIG.
2, represent configurations with wide1y different (but
resistance wise equivalent) second layers.
The first method for solving the equivalence problem, applies to curves that
are shaped like a beU or like an inverted beIl,
((!2
larger than (!l
and (!3;
or (!2
smaller than (!l
and
(!3
respectively).
FIG.
3.
Since the replacement values used by
CAGNIARD,
are found by using the
second branch of the resistivity curve, additional information is likely to be
~==--~---%L
FIG.
2 Two "equivalent" resistivity curves.
((I.
=
l/af
!!;
d.
=
dl;
(13=
(11and
(I.
=
1/19(11;d.
=
1/.d1;
(I.
= (11)with widely different second layers.
The interpretation of these curves faces obvious problems, since the two three layer
configura-tions are different from each other, but their resistivity curves are similar.
%Ll7rJt=r~~
%L
/7a/;01
a
b
FIG.
3 Three layer resistivity curves of which the second layer's resistivity is smaller
(a)
or
larger (b) than the first and third layer's resistivity.
found by using the first branch of the resistivity curve as weIl, this part of the
curve being largely shaped by the second layer. The idea can be practised as
foIlows:
Both branches of the curves are characterised by the tangents through their
inflection point, the part where they have maximum steepness.
FIG.
4.
The intersection of these two tangents is the point that can be used to
characterise the resistivity curve. The points can be joined for making a curve
for constant
(J2and variabie
d
2while apparently this curve is independent of
the third layer's resistivity
(J3.FIG.
5.
The curve of
FIG.
5, is independent of
(J3,the third layer's resistivity, a fact
that ean be demonstrated, by making the same kind of curve in
FIG.
6 for a
I'a/{-ll
Taf7!/ef7l Ihrol/g'h /nf/ecf/on po/ni
of Cl/rves second 6raf7ch
~--1---
--
----~~---~L
\
\
~ ~ ~\
\
\
,,/'
x -
/f7ler secf/on of lan9'enl.5
/
\
/
\ Tangenllhrol/!/h inllecl/on po/ni of
\ re.5/sfiv/1y ct/rYcs f/rslbranch
FIG.
4 Three layer resistivity curve
e2
=l/lOel;
e.
=el;
d
2
=dl.
The intersection of the two tangents is the point that can be used to characterise the resistivity
curve.
FIG. 5 A series of three layer curves
(e.
=
l/,rh; e.
=
el;
and varying
d.)
with a curve
joining the intersections of their tangents. The curves ha
v
e been taken from the CGG
collec-tion, [1955].
/ 0.2 / / / / / / / ;,' / /FIG. 6 A series of three la
y
er curves
(
e2
=1/,e1; e.
=
inf
.
and
v
arying
d
2)
with a curve
joining their intersections
.
---r---~~----~--~~~~--~--- ~L
~--==---%
---~
FIG.
7 A seri
e
s of three layer curves,
(
(I.
=1/,(11;
d.
=dl;
and varying
(I
.
)
with the same
curve as
in
FIGURES5 and 6, joining the intersections of their tangents
.
The three layer curves
have been tak
e
n from "Amt für Bodenforschung" in Hanover.
three layer series with an identical
e2
=
1/4(}1,but a different value for
es
(=
infinite).
The two curves of
FIG.
5, and
FIG.
6, are identical with each other. The
curves are also identical with a third one in
FIG.
7, made for a series of three
layer curves with the same
(?2=
1
/
4e1
and varying values of
(IS.It
is
demon-strated by
FIG.
5, 6 and 7, that regardless of the values for
d
2and
es,
the
inter-section curve for
(?2=
1/4(?1,is cdnstant. The same demonstration of identical
curves can be given for other vallles of
e2.
The "intersection" curves in
FIG.
8 and
FIG.
9, are made with resistivity
curves from "Amt für Bodenforschung" in Hanover. The "intersection"
curves are identical and independent of
(?s,which makes them suitable for
interpretation of the three layer configuration's resistivity of the second
layer.
In
case the second branch of the resistivity curve dips downwards with a
steepness in excess of 45° (like in
FIG.
8) the method's accuracy improves, if
----+---..~--.._--~,_----~~~---%L
FIG.
8
Two series ofthree layer curves from "Amt für Bodenforschung"
(e.
= 3el; es= ll/.el;
and
e.
=3el; es
=O.Iel; d./d
l= 1,2,3 resp.) with a curve joining the intersections of their
tangents. The tangents ofthe curves with es
=O.Iel> are drawn at 45°, instead ofthrough the
inflection points (at a steeper section) ofthe curves.
the tangent through the second branche's inflection point is replaced with a
tangent (at this second branch) of 45° steepness.
The series of computed resistivity curves from CGG are used for making a
graph of such "intersection" curves for different values of second layer's
resistivity
(22
in
FIG.
10. This graph can then be used [or determination of the
field curve af ter its first and second branches have yielded the intersection of
their steepest tangents.
A similar diagram can be made for curves of constant d
2and variabie
(22.
~L
FIG. 9 Two series ofthree layer curves from "Amt für Bodenforschung"
(P.
= 3el; ea
=
2el;
d./dl
=
1,2,4 and
e.
=
3el; ea
=
el;
dl/dl
=
1,2,3) with a curve joining the intersection
of their tangents.
10
----~---~--
--
---~---~L
0.1
YJ!J
FIG.
10 A group of curves like the curve in FIG. 5, for different values of resistivity second
layer
et.
FIG.
11. This diagram is somewhat more dependent on es however than the
diagram for constant
e2
and varia bIe
d
2
in FIG.
10. (In the extreme case where
e2/es
approaches 1, the curves approximate one vertical through
l/2L
=
5.5
for all values of
d
2 ).The use of the e2-diagram by itself however already solves
the d
2 ,af ter the replacement figure has been taken with CAGNIARD'S
diagram.
---+---+
__
~----~----~~---~L
o
.
z
FIG.
11
A diagram for different but constant values of
d.,
and variabie
!?,
similar to the
diagram
in
FIG. 10.
The ease of the method, (requiring just one extra diagram) suggests its use
as an addition to the method of CAGNIARD.
FIG.
12 demonstrates how the method is used:
lf
the "first cross" of the field
curve is placed on the origin of the diagram, the intersection of its steepest
tangents, determine resistivity and thickness of its second layer.
Application of this diagram to a variety of computed curves (from CGG
and "Amt für Bodenforschung in Hanover") has shown the method to be as
accurate as the plotted resistivity curves themselves. This is understandable,
since the diagram is made with tangents to a curve, fitting the points of the
curve themselves.
Latitude with the surface layer's determination of its "first cross", and
there-fore its thickness
dl
and resistivity
el,
influences the accuracy of the second
layer's determination, as treated in the last Chapter.
The diagrams of
FIG.
10, 11 and 12 have been made with resistivity curves
from CGG for the Schlumberger electrode configuration. Resistivity curves
for the Wenner electrode configuration, require a different but similar diagram
that has been made in
FIG.
13.
(Ja/PI
10~--+---~~~-+--~----~=---%L
/. /. /. 0./ /. /. / /. /. /. , / /. /. h /. /. /. /. /. /. /.FIG.
12 Diagram for the determination of second
l
ayer's resistivity
I?
and
thickness
d.,
with
a three layer curve, as an example of its use
.
---r---~----~---_r~---a
FIG.
13 An "intersection" curve
(e.
=
S/nel)
from a group of resistivity curves, for the
WENNER
electrode configuration,
[KOEFOED,1955]. Additional
WENNERresistivity curves
[MOONEY
&
WETZEL,1956] having been used to make the other "intersection" curves.
One of the "intersection" curves in this diagram, has been made with
resist-ivity curves from KOEFOED [1955], while the other curves were taken from
MOONEY and WETZEL [1956].
It
will be noted that the resistivity curves
and their intersection curves are
similar for Wenner- or Schlumberger-electrode configuration,
except
for a
ratio of the electrode distance coordinates in the order of3/
4 •The intersection method requires two tangents through the infiection points
of the curve. Not all the resistivity curves are shaped with two infiections
how-ever, like those in
FIG.
3. Since the "intersection" method depends on those
infiection points, another method is given in
the
next Chapter for curves of
a different type.
CHAPTER IV
SECOND METHOD FOR SOLVING THE
EQUIVALENCE PROBLEM
For solving the resistivity curves of which
(23/(22
and
(22/(21
are both larger than
1, and the curves of which
(23/(22
and
(22/(21
are both smaller than 1, FIG. 14,
another method is needed, and has been found to require no extra diagram,
but some careful measurements of the steepness or angle of the field curve.
The steepness of the resistivity curve is a measure for the resistivity contrast
at certain depth, of the total resistance of the layers above this depth and of
part of the layers below thls depth, as deep as the current penetration.
There-fore the resistivity curve's steepness is characteristic for
(22
at small electrode
distances or shallow current penetration, while an increasing part of the third
layer will be of influence at increased electrode distance. The steepness of the
resistivity curve at several points, can be measured by the steepness of its
tangents at those points, or by comparison with standard curves.
The method, using this concept, is based on finding a two layer standard
curve having exactly the same angle as the field curve at an electrode distance
1/2L
that has to be the same for both curves. FIG. 15.
FIG. 15 shows a three layer curve having a steepness of 30
°
at certain
elec-trode distance,
(1/2L
=
1.5). The steepness has a different value at another
electrode distance as shown in fig. 16, where the steepness of the threelayer
curve is 45
°
; (at
1/2L
=
1.9).
~...c~---1---".---
-
~L
a
b
FIG.
14
Three layer resistivity curves
(e./el
smaller than
1
in a;
e./rb
larger than
1
in b)
ofwhich the third layer's resistivity
e3
varies from zero to infinity.
---T~---_T/~O---~L
Two /ayer slal7O'ard cvrye
;02= ~~/0.1
Tnree /ayer cvrve;o2
=
~;O/--;03 -
~6;O/
,
-FIG. 15 A three layer curve and a two layer curve having a steepness of 30
°
at an electrode
distance, identical
(1/
2
L
=
P/
2)
for both curves.
;017/;01
--~~~---
____ rm
____________________
~L
0.1
Three layercilrye
P2=)4.P/;P.J=}f6;P/
FIG. 16 A three layer curve and a two layer curve having the same steepness (45
°
) at a
certain electrode distance
(1/2L
=
1.9
)
.
At this point a two layer curve of different
(!2/(!1 (1/6
instead oP/s) is found to
have the same steepness as the three layer curve.
The second layer's resistivity of the selected standard curve, will have some
value between the resistivity of the second, and that of the third layer under
consideration. At short electrode distance
(1/2L
=
1), the
(!2
of the selected
standard curve, approximates the resistivity of the three layer configuration's
second layer, since the current does not penetrate below it yet. At larger
electrode distance, the current reaches greater depth, and the standard curve's
(!2
approximates the three layer configuration's
pa,
(divided by the
replace-ment resistivity of the layers above this depth).
Since the method is intended to determine the resistivity
(!2
of the three
layer configuration's second layer, its steepness at short electrode distance is
most interesting. The matter would be solved if the
(!2
of the standard curve
having the same steepness, can be marked or plotted, at these short electrode
distances
.
The method can be practised by super imposing the three layer
curve on a series of two layer standard curves keeping their l/2L
=
1 axes on
top of each ot her, moving the three layer curve upwards and downwards. At
several electrode distances, the standard curve having the same steepness as
the field curve, is marked by intersecting its
(!
2
with the vertical through the
1/2L
value. The points obtained in this manner can be joined into a curve,
which will then serve to find the
(!2
of the field curve.
FIG.
17.
----r---~w~---
--
---%L
1 1 1I
I
1~
I
-_ I1 I 1 ... , I 1 ---"K-r---1 ... I~k~---l--
,
Slandard cl./rve pz
= ~ jO,_ _ _ _ _ _
.
_ _ _ _ Slandard cl./rve P2
=
16
p,
'"I
i-~---0.1
.5landardcl./rve
Pi:
= :1ZPI
...
...
...
,
...
...
....
....
--
-
Tóree /ayer field wrve
FIG
.
17
Illustration ofa three layer curve
(eo
=
l/.el;
e.
=
l
/
16el;
d
2=
dl
)
with several two
I
I
I
,
,
\
\
\
10 0./,oZ=.39(Y1
t99
~~
{J.J
-%
%-*
Curves
COflflecl;fl~Oil7!J
017fhe fwo ldyerJ. 'dl7dard
curve.J havil7g theJame
+'k
.sleepl7l?J.J
~
~
J~~
~
~
~
ffz
;/,6
%g
FIG.
18 A diagram of
two
layer
s~andardcurves, used for plotting ratio
ea/e.,
in
FIG.
19.
The ratios
ea/e.
are marked for points of the curve having a certain steepness by intersecting
a vertical through
its electrode
distance
I/.L
and a horizontal through
e.,
(resistivity
second
layer) of that standard curve. This is indicated in
FIG
.
18, for a standard curve
(e.
=l/SeI)
having a steepness of
30
°
at electrode distance
I/.L
=1.75.
The aid curve derived in this manner from the field curve, has a horizontal
asymptote for short electrode di stance
1/2L,
since at these points the second
layer's resistivity of the standard curves, approximate the second layer's
resistivity of the three layer configuration. The aid curve also has a horizontal
asymptote for large electrode distances where the second branch of the field
curve, can be fitted to one and the same standard curve in
CAGNIARD'S
manner.
The aid curve thus derived, having parallel horizontal asymptotes at both
ends, is shaped distinctly similar to the two layer curves. Both having
pa-rallel asymptotes at each end of the curve with a smoothly joining middle
section.
Rigorous proof for the similarity of the two different kind of curves, requiring
their mathematical representation, is beyond the scope of dus paper.
Applica-tion of the "steepness" method, to a number of computed three layer curves,
10
%L
I
FIG.
19 A diagram of
ea/e!
ratios derived from a series of two layer standard curves,
that ....
n.
be used for the interpretation of a three layer curve.
" .
29
i
ISO-_-t---,L-
_ _ _ _ _
_ _ _ _ _ _ _ _
-+'=-o _
_ _ _
_ _
%L
I
~
I
~
I
I
I
I
I
~
I
"
I
~
",+"
0-"
"
I
I
7,0
'+
"
FIG.
20
Three layer
resistivity
curve
(ll.
=
l/.(h;
e.
=
l/lOel;
d.
=
dl
)
with an aid curve
derived from it for the determination of resistivity second layer
e
•.
however can he taken as an indication of its practicahility. This application
of the "steepness method" will he given in the next Chapter. Once their
sim-ilarity to the aid curve, derived from the three layer curve, is accepted, the
two layer standard curves can he used for comparison purposes. The cross of
the standard curve, matching the aid curve, determines the second layer's
•
resistivity
f}2of the three layer configuration, just like the standard curve's
cross determÏnes resistivity and thickness of the surf ace layer.
Whereas the method is primarily intended for finding
f}2,or second layer's
resistivity of the field curve, it yields a curve that can he used to find its
thick-ness
d2
as well.
If
the
f}2/f}1ratio of a three layer configuration has a value
he-tween
1/2
and 2, there seems to grow an error in this determination of
d
2 ;this
question will he part of
th~ discussion on errors in second layer's resistivity
f}2,caused hy errors with the first cross.
Since the method requires considerahle care to select or interpolate the right
standard curve, as far as its steepness is concerned, it may he easier to measure
th~ field curve's
~teepness
directly with a protractor than hy comparison with
by the use of a protractor instead of the standard curve series, since these
measurements are just two ways of putting the original idea into practise.
For this purpose a diagram of "constant angle" curves can be prepared from
the series of standard curves. A "constant angle" curve is made by finding the
ratio between
(la
and
(l2
of all the two layer standard curves where they have
that same angle of steepness. FIG. 18 and FIG. 19.
A diagram is made for curves of 15°,30°,45
°
and 60°, other sequences being
possib1e. The same degrees of steepness can then be measured at certain points
of the field curve. The electrode distance
1/2L
of these points is then used in
the diagram to find the corresponding ratio between field curve and the curve
to be derived from it. FIG. 20, shows the three layer sounding curve
d2
=
1;
(l2
=
1/4;
(la=
1/16,
from CGG with the aid curve derived from it for the
determination of its second layer's resistivity
(l2
=
1/4(l1.
The ratio A-B for 30
°
, (at
1/2L
=
11/2) has been taken from FIG. 19, the
other ratios having been taken simi1ar1y.
CHAPTER
V
APPLICATION OF THE SECOND METHOD
TO COMPUTED CURVES
Since the "steepness method" applies to a curve type (FIG. 14) of which only
a few computed resistivity curves were available, a number of these curves
had to be computed specifically for a check on the accuracy or usefulness of the
method.
FIGURES 21-24, show a selected number of those computed three 1ayer
curves with their aid curves for the determination of their second 1ayer's
resis-tivity.
The curves have been computed for the WENNER electrode configuration,
requiring a diagram (FIG. 26) a little different from the diagram in FIG. 19,
(for the SCHLUMBERGER configuration).
Points of the curves where their tangents have a certain steepness are marked
as indicated. In all these examples the aid curves have been compared with
two layer standard curves (FIG. 25) for determination of the threelayer
con-figuration's second layer.
This comparison has provided each aid curve with a cross, thus marking
resistivity as weil as thickness ofthe configuration's second layer. The reliability
of the "steepness method" depends on the accuracy of the resistivity curve for
+
---+--+
10 é1
FIG. 21
Three "equivalent" three layer resistivity curves, and
their
interpretation, using the
ea/e.
from FIG. 26.
The curves' parameters are:
e./e1
=1,2,3;
d./d
1
=1,2,3;
e.
=gel>
resp.
---+-+-+-+-... +'
FIG. 22 Two "equivalent" three layer curves, and their interpretation. Their parameters
are:
e./(h
=3,6;
d./d
1
=1/2>
1;
es
=ge1'
respectively.
For solving the three layer curve, an aid curve can be made, by "adding"
ea/e.
at several
points
of
measured steepness. The aid curve, solves
e.
and dl of the three layer curve, with its
first "cross".
?a/,/J'
ISO
____
~_4---~~
--
~~---~~~O---a
--+- ...
"
--+----033
---+----
+
Ol
00625'FIG. 23 Three layer curves and their interpretation, using
ea/e.
ratios
from
FIG. 26. The
parameters of the three layer curves have been selected to make the curves
"equivalent"
to
each other. These parameters are: e./el
=
l/S'
1/., 1/0;
d./d
1
=
1,2,3; Ps
=
1/Ue1'
resp.
10
a
~~~--+-~~--~--~~---~---+
0.2
---+----+
short electrode distances.
If
the points of the aid curve, can not be joined with
a smooth curve, this would indicate an unlikely section of the resistivity curve.
Such sections can be eliminated by measuring more suitable parts of the
curve with tangents for different steepness values. Generally the precision of
the curve improves proportionally with the thickness of the second layer.
Inaccuracy due to latitude with the "first cross" will be treated in the last
Chapter.
CHAPTER VI
ELECTRONICALL Y COMPUTED THREE LAYER CURVES
In order to obtain more evidence for the use of the "steepness method" more
curves were needed as a check.
About two hundred three layer curves have been computed with an
elec-tronic computer for this purpose. The method as described by
KOEFOED,
O.
[1955] has been used for making the "Algol" program for the electronic
computer (TR 4). The image pole series has been continued in this program
beyond a certain Ininimum number, until reaching an image pole with a
contribution of less than O.OOl12a.
The curves have been selected to provide a variety of equivalent cases, for
123/122
and 122/121 both larger than 1; or both ratios smaller than
l.
Six different values of 123, ranging from 123
=
lh6121
to 123
=
16121,
have been
selected, each with about five different 122 (resistivity second layer) and seven
different
d
2(thickness second layer) values.
The curves as well as their "Algol" programIning, are given in Annex A.
The "Algol" program can repeatedly be used for computing all possible
three layer configurations, for seven different
d
2's
on an infinite bottornlayer.
The Wenner electrode configuration has been used for all the electronically
computed curves.
Since the two layer standard curves for the Wenner electrode configuration
are different from those computed for the Schlumberger configuration,
FIG.
25
and
FIG
.
26 respectively show these standard curves and their diagram of
12a/122
ratios.
It
will be noted that the curves are almost identical, except for
a shift of the electrode distance axis in the order of
3/4.
/0
8
_ _
- - . 3
FIG.
25 Two layer standard curves
for
WENNERelectrode configuration.
A-B current electrode distance 3a.
m-n potential electrode distance a.
350 ~Oo ,350 20° /SO 2 10 0
a
!SO.30°
450 60° 0.1FIG.
26 Aid curves derived from
WENNERtwo la
y
er standard curves for the interpretation
of three layer curves.
CHAPTER VII
ERRORS DUE TO LATITUDE WITH THE FIRST CROSS
As described in the introduction, the first cross of the three layer curve is taken
from the two layer standard curve, having the c10sest resembling shape over
the greatest possible length. There is some latitude with the choice of the
standard curve however, creating a possible error with the first cross and the
resulting first layer's thickness dl and resistivity el of the three layer curve.
This error influences the second layer's
d
z
and
e2
as weil, since these are
expressed in el and dl as a ratio. Apart from this ratio, there is another re1ation
ship, which causes a more complicated error with CAGNIARD'S method as weil
as with the steepness method. In view of this possible error both methods are
compared herewith:
Tr{/f!
pOJ/'lOn
TirJ! cross
field
curve
Correcf
pOJtiion
2 nd cross
Shifled
pos/f/on
sec on
if
cross
0.1 ~--l--O.2 ~---o.f ~-~I--O.OSFIG. 27 Interpretation of three layer (or field) curve, (Is
=
1/19(11;es =
l/au(!1;
dl
=
dl>
with
CAGNIARD'sdiagram
(e.
=0).
Latitude with the first cross, leads to an error
in
the interpretation of resistivity and thickness
second layer.
\
Correcf
Znd cros",
Shifted
2 ndcro",,,
0.1 10r----r---+-____
0.7 T---OJ~ - - - 0.2 0./FIG.
28 Interpretation of a three layer curve with
CAGNIARD'Sdiagram.
A vertical shift
with the
first cross,
causes
an
error
in the determination of the thickness and
resistivity of the three layer curve's second layer.
Using
CAGNIARD'S
method, the field curve's first cross is placed on the origin
of
CAGNIARD'S
graph, whereupon second layer's thickness and resistivity are
determined by the position of the second cross. Latitude with the first cross
therefore causes the same latitude with the relative position of the second cross.
Depending on the value of
{!2,
and the spacing between the
{!2
lines of
CAG-NIARD'S
network, this causes errors of varying importance.
If
the first cross is shifted too much to the left (right) this not only decreases
(increases) dl, but also increases, (decreases) the ratio
{!2/{!1
and d
2/d
l •If
the
first cross is shifted too high,
(low)
this not only increases
{!l,
but also decreases,
(increases) the ratio
{!2/{!1,
in a somewhat larger degree than the shift of the
first cross.
Using
CAGNIARD'S
network, th ere is no tight rule for the precise results of
errors with the first cross, since these results depend too much on the value of
second layer's resistivity and thickness. Generally, the errors loose (gain)
importance with increasing (decreasing) thickness second layer.
The diagram used for the "intersection method"
FIG.
12, causes similar
inaccuracy as
CAGNIARD'S
diagram, due to latitude with the first cross.
Using the "steepness" method, latitude with the first cross, leads to a similar
{!2/{!1
error as with
CAGNIARD'S
method, in a different manner:
38
If
the first cross is shifted too far left, (right) this not only decreases
(in-creases)
dl,
but also decreases, (increases) the steepness of the curve's tangent
at each electrode distance
1/2L.
This in turn, increases the ratio
(22/(21,
see
FIG.
29. As aresult, resistivity second layer
(22,
would be deterrninèd too large,
(for those cases where
(21/22
is smaller than 1).
This left ward shift of the first cross represents a subsurface configuration
with a second layer of which the resistivity
(22
=
(21.
This extra layer should
have been included in the surf ace layer if the first cross had been determined
in the proper position. This resistivity
(22
=
(21
can be accurately deterrnined
unless the shift of the curve is quite small.
If
resistivity of the second layer
(22,
approximates resistivity of the third
layer
(23,
the accuracy of the method improves, since such a curve resembles
one of the standard curves on which the method is based.
If
the cross is shifted too high, (low) this increases (decreases)
(21,
but there
is no further change in
(22,
since the steepness of the resistivity curve at each
electrode distance value
1/2L
remains unaffected.
If
compared, the errors from a horizontal shift of the first cross, with
GAG-
--"-"
"-"
"--
...
0./"-,
"
" ,
"-"
,
,
"
,
,
,
,
"-10"-"
"
...
"
,
"-" "-"
...FIG.
29
Interpretation of a three layer curve
Ü?2
=
l/,(!1; es
=
l/leel;
d.
=
dl)
with
"steep-ness" method.
An
erroneous horizontal shift of the first cross, causes an error in the interpretation of resistivity
second layer
el'
NIARD'S
method and with the "steepness" method, show similar results. A
vertical shift of the first cross, involves a larger error with the CAGNIARD
method, than with the steepness method.
Considering the shape of the curves in FIG. 19 and FIG. 26, it is tempting
to formulate them with mathematical expressions. The expression
eah!l
=
=
(1/2
L-0.8)
W/
2
L
-
0.3)
fits the curve for 15
°
quite accurately (for the curves
of 30, 45 and 60
°
the constants 0.8 and 0.3 are 1.1, 0.3; 1.5, 0.5; and 2.0, 0.5;
respectively and have to he multiplied with 0.75 if the WENNER electrode
configuration is used).
The whole standard curve series
(e2lel
smaller than 1
)
is represented with these
simple formulas, and the standard curves can actually he constructed, using
these formulas to give steepness at each point of the curve. The mathematical
procedure in case of a three layer curve would be too complicated however to
he of advantage over the graphical method for solving them.
CONCLUSION
The equivalence phenomenon causes latitude in the interpretation of
geo-electric resistivity curves, in terms of thickness and resistivity of the suhsurface
layers.
An effort has been made to find the characteristics of the field curve leading
to better accuracy.
As aresult, this paper gives two simple methods, and illustrates their use
with several kinds of three layer resistivity curves .
.
These methods can usefully be employed as an addition to the earlier known
procedures for solving three layer resistivity curves.
ACKNOWLEDGEMENTS
The au thor is indebted to "Wiskundige dienst" (Mathematical dept) of T.H.
Delft, and specifically to Mr. L.
B.
D. HARKEMA, for his assistance with the
programming for the electronic computer TR 4.
REFERENCES
KOEFOED,