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IR1210

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Block Diagram

Package

Product Summary

I O +/- 1.5A / 1.5A

V OUT 6V - 20V

t on/off (typ.) 85 & 65 ns

DUAL LOW SIDE DRIVER

Features

Gate drive supply range from 6 to 20V

CMOS Schmitt-triggered inputs with pull-up

Matched propagation delay for both channels

Outputs out of phase with inputs

Description

The IR1210 is a low voltage, high speed power MOSFET and IGBT driver. Proprietary latch immune CMOS technologies enable ruggedized monolithic construction. Logic inputs are compatible with stan- dard CMOS or LSTTL outputs. The output drivers feature a high pulse current buffer stage designed for minimum driver cross-conduction. Propagation delays between two channels are matched.

8 Lead SOIC

8

7

6

5 4

3 2 1

N C

O U T A

V s I N A

G N D

I N B O U T B N C

IR1210 I N B

I N A

T O

L O A D

Please see new data sheet

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Symbol Definition Min. Max. Units

VS Fixed supply voltage -0.3 25

VO Output voltage -0.3 VS + 0.3

VIN Logic input voltage (INA/N & INB/N) -0.3 VS + 0.3

PD Package power dissipation @ TA ≤ +25°C — 0.625 W

RthJA Thermal resistance, junction to ambient — 200 °C

/

W

TJ Junction temperature — 150

TS Storage temperature -55 150

TL Lead temperature (soldering, 10 seconds) — 300

Absolute Maximum Ratings

Absolute maximum ratings indicate sustained limits beyond which damage to the device may occur. All voltage param- eters are absolute voltages referenced to GND. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions.

V

°C

Symbol Definition Min. Max. Units

VS Fixed supply oltage 6 20

VO Output voltage 0 VS

VIN Logic input voltage (INA/N & INB/N) 0 VS

TA Ambient temperature -40 125

Recommended Operating Conditions

The input/output logic timing diagram is shown in figure 1. For proper operation the device should be used within the recommended conditions. All voltage parameters are absolute voltages referenced to GND.

°C V

Symbol Definition Min. Typ. Max. Units Test Conditions

VIH Logic “0” input voltage (OUT=LO) 2.7 — —

VIL Logic “1” input voltage (OUT=HI) — — 0.8

VOH High level output voltage, VBIAS-VO — — 1.2

VOL Low level output voltage, VO — — 0.1

IIN+ Logic “1” input bias current (OUT=HI) — 5 15 VIN = 0V

IIN- Logic “0” input bias current (OUT=LO) — -10 -30 VIN = VS

IQS Quiescent Vs supply current — 100 200 VIN = 0V or VS

IO+ Output high short circuit pulsed current 1.5 2.3 — VO = 0V, VIN = 0 PW ≤ 10 µs IO- Output low short circuit pulsed current 1.5 3.3 — VO = 15V, VIN = VS

PW ≤ 10 µs

DC Electrical Characteristics

VBIAS (VS) = 15V, TA = 25°C unless otherwise specified. The VIN, and IIN parameters are referenced to GND and are applicable to input leads: INA/N and INB/N. The VO and IO parameters are referenced to GND and are applicable to the output leads: OUTA and OUTB.

A µA

V

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Functional Block Diagram

Lead Assignment and Definitions

Symbol Description

VS Supply voltage

GND Ground

INA Logic input for gate driver output (OUTA), out of phase INB Logic input for gate driver output (OUTB), out of phase OUTA Gate drive output A

OUTB Gate drive output B

Symbol Definition Min. Typ. Max. Units Test Conditions

td1 Turn-on propagation delay — 85 160

td2 Turn-off propagation delay — 65 150

tr Turn-on rise time — 15 35

tf Turn-off fall time — 10 25

Dynamic Electrical Characteristics

VBIAS (VS) = 15V, CL = 1000 pF, TA = 25°C unless otherwise specified.

INA GND INB

OUTA VS OUTB ns figures 2 & 3

PREDRV D R V

PREDRV D R V

G N D OUTB OUTA Vs

INB INA

Vs 5V

5V

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8 Lead SOIC

01-0021 08

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Figure 1. Timing Diagram Figure 2. Switching Time Waveforms

Figure 3. Switching Time Test Circuit INA

I N B

O U T A O U T B

I N A I N B

O U T A O U T B

td1 tr

5 0 %

9 0 %

1 0 %

5 0 %

9 0 %

1 0 % td2 tf

INA

INB

O U T A

O U T B 5

7

3

6 4 . 7 U F

0 . 1 U F

CL = 1 0 0 0 P F

CL = 1 0 0 0 P F VS = 15V

2

4

WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245 Tel: (310) 252-7105 Data and specifications subject to change without notice. 12/20/2000

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